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Title: Invited Article: Simultaneous mapping of temperature and stress in microdevices using micro-Raman spectroscopy

Abstract

Abstract not provided.

Authors:
; ; ; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1426987
Report Number(s):
SAND2007-0693J
Journal ID: ISSN 0034-6748; 524118
DOE Contract Number:
AC04-94AL85000
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 78; Journal Issue: 6
Country of Publication:
United States
Language:
English

Citation Formats

Beechem, Thomas, Graham, Samuel, Kearney, Sean P., Phinney, Leslie M., and Serrano, Justin R. Invited Article: Simultaneous mapping of temperature and stress in microdevices using micro-Raman spectroscopy. United States: N. p., 2007. Web. doi:10.1063/1.2738946.
Beechem, Thomas, Graham, Samuel, Kearney, Sean P., Phinney, Leslie M., & Serrano, Justin R. Invited Article: Simultaneous mapping of temperature and stress in microdevices using micro-Raman spectroscopy. United States. doi:10.1063/1.2738946.
Beechem, Thomas, Graham, Samuel, Kearney, Sean P., Phinney, Leslie M., and Serrano, Justin R. Fri . "Invited Article: Simultaneous mapping of temperature and stress in microdevices using micro-Raman spectroscopy". United States. doi:10.1063/1.2738946. https://www.osti.gov/servlets/purl/1426987.
@article{osti_1426987,
title = {Invited Article: Simultaneous mapping of temperature and stress in microdevices using micro-Raman spectroscopy},
author = {Beechem, Thomas and Graham, Samuel and Kearney, Sean P. and Phinney, Leslie M. and Serrano, Justin R.},
abstractNote = {Abstract not provided.},
doi = {10.1063/1.2738946},
journal = {Review of Scientific Instruments},
number = 6,
volume = 78,
place = {United States},
year = {Fri Jun 01 00:00:00 EDT 2007},
month = {Fri Jun 01 00:00:00 EDT 2007}
}
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