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Title: High temperature irradiation induced creep in Ag nanopillars measured via in situ transmission electron microscopy

Abstract

Irradiation induced creep (IIC) rates are measured in compression on Ag nanopillar (square) beams in the sink-limited regime. The IIC rate increases linearly with stress at lower stresses, i.e. below ≈2/3 the high temperature yield stress and parabolically with pillar width, L, for L less than ≈300 nm. Here, the data are obtained by combining in situ transmission electron imaging with simultaneous ion irradiation, laser heating, and nanopillar compression. Results in the larger width regime are consistent with prior literature.

Authors:
 [1];  [2];  [2];  [2];  [1];  [1]
  1. Univ. of Illinois, Urbana-Champaign, IL (United States). Dept. of Materials Science and Engineering
  2. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1426801
Report Number(s):
SAND-2018-1672J
Journal ID: ISSN 1359-6462; 660698
Grant/Contract Number:
AC04-94AL85000
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Scripta Materialia
Additional Journal Information:
Journal Volume: 148; Journal Issue: C; Journal ID: ISSN 1359-6462
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY; Irradiation induced creep; Silver films; In situ transmission electron microscopy (TEM); Defects

Citation Formats

Jawaharram, Gowtham Sriram, Price, Patrick M., Barr, Christopher M., Hattar, Khalid, Averback, Robert S., and Dillon, Shen J. High temperature irradiation induced creep in Ag nanopillars measured via in situ transmission electron microscopy. United States: N. p., 2018. Web. doi:10.1016/j.scriptamat.2018.01.007.
Jawaharram, Gowtham Sriram, Price, Patrick M., Barr, Christopher M., Hattar, Khalid, Averback, Robert S., & Dillon, Shen J. High temperature irradiation induced creep in Ag nanopillars measured via in situ transmission electron microscopy. United States. doi:10.1016/j.scriptamat.2018.01.007.
Jawaharram, Gowtham Sriram, Price, Patrick M., Barr, Christopher M., Hattar, Khalid, Averback, Robert S., and Dillon, Shen J. Tue . "High temperature irradiation induced creep in Ag nanopillars measured via in situ transmission electron microscopy". United States. doi:10.1016/j.scriptamat.2018.01.007.
@article{osti_1426801,
title = {High temperature irradiation induced creep in Ag nanopillars measured via in situ transmission electron microscopy},
author = {Jawaharram, Gowtham Sriram and Price, Patrick M. and Barr, Christopher M. and Hattar, Khalid and Averback, Robert S. and Dillon, Shen J.},
abstractNote = {Irradiation induced creep (IIC) rates are measured in compression on Ag nanopillar (square) beams in the sink-limited regime. The IIC rate increases linearly with stress at lower stresses, i.e. below ≈2/3 the high temperature yield stress and parabolically with pillar width, L, for L less than ≈300 nm. Here, the data are obtained by combining in situ transmission electron imaging with simultaneous ion irradiation, laser heating, and nanopillar compression. Results in the larger width regime are consistent with prior literature.},
doi = {10.1016/j.scriptamat.2018.01.007},
journal = {Scripta Materialia},
number = C,
volume = 148,
place = {United States},
year = {Tue Jan 30 00:00:00 EST 2018},
month = {Tue Jan 30 00:00:00 EST 2018}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on January 30, 2019
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