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Title: Generalized skew-symmetric interfacial probability distribution in reflectivity and small-angle scattering analysis

Abstract

Generalized skew-symmetric probability density functions are proposed to model asymmetric interfacial density distributions for the parameterization of any arbitrary density profiles in the `effective-density model'. The penetration of the densities into adjacent layers can be selectively controlled and parameterized. A continuous density profile is generated and discretized into many independent slices of very thin thickness with constant density values and sharp interfaces. The discretized profile can be used to calculate reflectivities via Parratt's recursive formula, or small-angle scattering via the concentric onion model that is also developed in this work.

Authors:
 [1]; ORCiD logo [2]
  1. Argonne National Lab. (ANL), Argonne, IL (United States)
  2. Argonne National Lab. (ANL), Argonne, IL (United States); Univ. of Chicago, IL (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Scientific User Facilities Division
OSTI Identifier:
1426781
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Applied Crystallography (Online)
Additional Journal Information:
Journal Volume: 50; Journal Issue: 6; Journal ID: ISSN 1600-5767
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; Asymmetric interface; Form factor; Interface density profile; Reflectivity; Roughness; Small-angle scattering

Citation Formats

Jiang, Zhang, and Chen, Wei. Generalized skew-symmetric interfacial probability distribution in reflectivity and small-angle scattering analysis. United States: N. p., 2017. Web. doi:10.1107/S1600576717013632.
Jiang, Zhang, & Chen, Wei. Generalized skew-symmetric interfacial probability distribution in reflectivity and small-angle scattering analysis. United States. doi:10.1107/S1600576717013632.
Jiang, Zhang, and Chen, Wei. Fri . "Generalized skew-symmetric interfacial probability distribution in reflectivity and small-angle scattering analysis". United States. doi:10.1107/S1600576717013632. https://www.osti.gov/servlets/purl/1426781.
@article{osti_1426781,
title = {Generalized skew-symmetric interfacial probability distribution in reflectivity and small-angle scattering analysis},
author = {Jiang, Zhang and Chen, Wei},
abstractNote = {Generalized skew-symmetric probability density functions are proposed to model asymmetric interfacial density distributions for the parameterization of any arbitrary density profiles in the `effective-density model'. The penetration of the densities into adjacent layers can be selectively controlled and parameterized. A continuous density profile is generated and discretized into many independent slices of very thin thickness with constant density values and sharp interfaces. The discretized profile can be used to calculate reflectivities via Parratt's recursive formula, or small-angle scattering via the concentric onion model that is also developed in this work.},
doi = {10.1107/S1600576717013632},
journal = {Journal of Applied Crystallography (Online)},
issn = {1600-5767},
number = 6,
volume = 50,
place = {United States},
year = {2017},
month = {11}
}

Journal Article:
Free Publicly Available Full Text
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