Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis

Dagdeviren, Omur E.; Schwarz, Udo D.

doi:10.3762/bjnano.8.70

Title: Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis

Journal Article · Mon Mar 20 00:00:00 EDT 2017 · Beilstein Journal of Nanotechnology

DOI:https://doi.org/10.3762/bjnano.8.70· OSTI ID:1426778

Dagdeviren, Omur E. ^[1]; Schwarz, Udo D. ^[1]

Yale Univ., New Haven, CT (United States)

Quartz tuning forks that have a probe tip attached to the end of one of its prongs while the other prong is arrested to a holder (“qPlus” configuration) have gained considerable popularity in recent years for high-resolution atomic force microscopy imaging. The small size of the tuning forks and the complexity of the sensor architecture, however, often impede predictions on how variations in the execution of the individual assembly steps affect the performance of the completed sensor. Extending an earlier study that provided numerical analysis of qPlus-style setups without tips, this work quantifies the influence of tip attachment on the operational characteristics of the sensor. The results using finite element modeling show in particular that for setups that include a metallic tip that is connected via a separate wire to enable the simultaneous collection of local forces and tunneling currents, the exact realization of this wire connection has a major effect on sensor properties such as spring constant, quality factor, resonance frequency, and its deviation from an ideal vertical oscillation.

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Research Organization:: Yale Univ., New Haven, CT (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: sC0016179

OSTI ID:: 1426778

Journal Information:: Beilstein Journal of Nanotechnology, Vol. 8; ISSN 2190-4286

Publisher:: Beilstein InstituteCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 10 works

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The qPlus sensor, a powerful core for the atomic force microscope Giessibl, Franz J. Review of Scientific Instruments, Vol. 90, Issue 1 https://doi.org/10.1063/1.5052264	journal	January 2019
Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors Dagdeviren, Omur E.; Miyahara, Yoichi; Mascaro, Aaron Review of Scientific Instruments, Vol. 90, Issue 1 https://doi.org/10.1063/1.5061831	journal	January 2019
Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance Dagdeviren, Omur E.; Schwarz, Udo D. Review of Scientific Instruments, Vol. 90, Issue 3 https://doi.org/10.1063/1.5089634	journal	March 2019
Torque Differential Magnetometry Using the qPlus Mode of a Quartz Tuning Fork Chen, Lu; Yu, Fan; Xiang, Ziji Physical Review Applied, Vol. 9, Issue 2 https://doi.org/10.1103/physrevapplied.9.024005	journal	February 2018
Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis Dagdeviren, Omur E.; Zhou, Chao; Altman, Eric I. Physical Review Applied, Vol. 9, Issue 4 https://doi.org/10.1103/physrevapplied.9.044040	journal	April 2018
Sensing Performance Analysis on Quartz Tuning Fork-Probe at the High Order Vibration Mode for Multi-Frequency Scanning Probe Microscopy Zhang, Xiaofei; Gao, Fengli; Li, Xide Sensors, Vol. 18, Issue 2 https://doi.org/10.3390/s18020336	journal	January 2018

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Title: Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis

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