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Title: Identification and Analysis of Partial Shading Breakdown Sites in CuInxGa(1-x)Se2 Modules

Journal Article · · Solar Energy
 [1];  [2];  [3];  [2];  [1];  [2];  [2];  [2]
  1. Colorado School of Mines, Golden, CO (United States)
  2. National Renewable Energy Lab. (NREL), Golden, CO (United States)
  3. Forschungszentrum Julich (Germany)
+ Show Author Affiliations

In this paper, CuInxGa(1-x) (CIGS) mini-modules are stressed under reverse bias, resembling partial shading conditions, to predict and characterize where failures occur. Partial shading can cause permanent damage in the form of 'wormlike' defects on thin-film modules due to thermal runaway. This results in module-scale power losses. We have used dark lock-in thermography (DLIT) to spatially observe localized heating when reverse-bias breakdown occurs on various CIGS mini-modules. For better understanding of how and where these defects originated and propagated, we have developed techniques where the current is limited during reverse-bias stressing. This allows for DLIT-based detection and detailed studying of the region where breakdown is initiated before thermal runaway leads to permanent damage. Statistics of breakdown sites using current-limited conditions has allowed for reasonable identification of the as-grown defects where permanent breakdown will likely originate. Scanning electron microscope results and wormlike defect analysis show that breakdown originates in defects such as small pits, craters, or cracks in the CIGS layer, and the wormlike defects propagate near the top CIGS interface.

Research Organization:
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
Grant/Contract Number:
AC36-08GO28308; EE0007141
OSTI ID:
1426646
Alternate ID(s):
OSTI ID: 1549003
Report Number(s):
NREL/JA-5K00-70651
Journal Information:
Solar Energy, Vol. 161, Issue Feb. 2018; ISSN 0038-092X
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 19 works
Citation information provided by
Web of Science

References (6)

Microplasma breakdown and hot-spots in silicon solar cells journal September 1989
Correlations of Cu(In, Ga)Se 2 imaging with device performance, defects, and microstructural properties
  • Johnston, Steve; Unold, Thomas; Repins, Ingrid
  • Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 30, Issue 4 https://doi.org/10.1116/1.4714358
journal July 2012
Investigation of damage caused by partial shading of CuInxGa (1-x) Se 2 photovoltaic modules with bypass diodes : Investigation of damage caused by partial shading journal April 2016
Thermal and Electrical Effects of Partial Shade in Monolithic Thin-Film Photovoltaic Modules journal November 2015
Partial shade stress test for thin-film photovoltaic modules conference September 2015
Characterization of Cu(In,Ga)Se2 photovoltaic modules journal May 2007

Cited By (4)

Impact of Buffer Layer Process and Na on Shunt Paths of Monolithic Series-connected CIGSSe Thin Film Solar Cells journal March 2019
A full overview of international standards assessing the long-term stability of perovskite solar cells journal January 2018
Characterization and modeling of reverse‐bias breakdown in Cu(In,Ga)Se 2 photovoltaic devices journal June 2019
Reliability implications of partial shading on CIGS photovoltaic devices: A literature review journal December 2019

Figures / Tables (9)

Table 1(p. 6)table Table 1
Fig. 1(p. 11)figure Fig. 1
Fig. 2(p. 12)figure Fig. 2
Fig. 3(p. 13)figure Fig. 3
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Fig. 5(p. 15)figure Fig. 5
Fig. 6(p. 16)figure Fig. 6
Fig. 7(p. 17)figure Fig. 7
Fig. 8(p. 18)figure Fig. 8

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14 SOLAR ENERGY
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thermal analysis
breakdown voltage