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Title: Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography

Abstract

III - As nanowires are candidates for near-infrared light emitters and detectors that can be directly integrated onto silicon. However, nanoscale to microscale variations in structure, composition, and strain within a given nanowire, as well as variations between nanowires, pose challenges to correlating microstructure with device performance. In this work, we utilize coherent nanofocused X-rays to characterize stacking defects and strain in a single InGaAs nanowire supported on Si. By reconstructing diffraction patterns from the 2110 Bragg peak, we show that the lattice orientation varies along the length of the wire, while the strain field along the cross-section is largely unaffected, leaving the band structure unperturbed. Diffraction patterns from the 0110 Bragg peak are reproducibly reconstructed to create three-dimensional images of stacking defects and associated lattice strains, revealing sharp planar boundaries between different crystal phases of wurtzite (WZ) structure that contribute to charge carrier scattering. Phase retrieval is made possible by developing multiangle Bragg projection ptychography (maBPP) to accommodate coherent nanodiffraction patterns measured at arbitrary overlapping positions at multiple angles about a Bragg peak, eliminating the need for scan registration at different angles. The penetrating nature of X-ray radiation, together with the relaxed constraints of maBPP, will enable the inmore » operando imaging of nanowire devices.« less

Authors:
ORCiD logo [1];  [2];  [3];  [4];  [2];  [5]; ORCiD logo [5];  [1];  [6];  [6];  [6];  [6];  [2];  [3]; ORCiD logo [1];  [2]
+ Show Author Affiliations
  1. Northwestern Univ., Evanston, IL (United States). Dept. of Materials Science and Engineering
  2. Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division
  3. Aix-Marseille Univ., and CNRS/IN2P3, Marseille (France)
  4. Argonne National Lab. (ANL), Argonne, IL (United States). Center for Nanoscale Materials
  5. Technische Univ. Munich (Germany). Walter Schottky Inst. and Physik Dept.
  6. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States); Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division; European Union (EU); National Science Foundation (NSF); German Research Foundation (DFG); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1425485
Alternate Identifier(s):
OSTI ID: 1426467
Report Number(s):
BNL-203363-2018-JAAM
Journal ID: ISSN 1530-6984; 138261; TRN: US1802116
Grant/Contract Number:  
AC02-06CH11357; SC0012704
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Nano Letters
Additional Journal Information:
Journal Volume: 18; Journal Issue: 2; Journal ID: ISSN 1530-6984
Publisher:
American Chemical Society
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; Bragg ptychography; III-V; coherent X-ray diffraction imaging; nanowire; stacking faults; strain imaging; 77 NANOSCIENCE AND NANOTECHNOLOGY

Citation Formats

Hill, Megan O., Calvo-Almazan, Irene, Allain, Marc, Holt, Martin V., Ulvestad, Andrew, Treu, Julian, Koblmüller, Gregor, Huang, Chunyi, Huang, Xiaojing, Yan, Hanfei, Nazaretski, Evgeny, Chu, Yong S., Stephenson, G. Brian, Chamard, Virginie, Lauhon, Lincoln J., and Hruszkewycz, Stephan O. Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography. United States: N. p., 2018. Web. doi:10.1021/acs.nanolett.7b04024.
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Hill, Megan O., Calvo-Almazan, Irene, Allain, Marc, Holt, Martin V., Ulvestad, Andrew, Treu, Julian, Koblmüller, Gregor, Huang, Chunyi, Huang, Xiaojing, Yan, Hanfei, Nazaretski, Evgeny, Chu, Yong S., Stephenson, G. Brian, Chamard, Virginie, Lauhon, Lincoln J., & Hruszkewycz, Stephan O. Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography. United States. doi:10.1021/acs.nanolett.7b04024.
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Hill, Megan O., Calvo-Almazan, Irene, Allain, Marc, Holt, Martin V., Ulvestad, Andrew, Treu, Julian, Koblmüller, Gregor, Huang, Chunyi, Huang, Xiaojing, Yan, Hanfei, Nazaretski, Evgeny, Chu, Yong S., Stephenson, G. Brian, Chamard, Virginie, Lauhon, Lincoln J., and Hruszkewycz, Stephan O. Mon . "Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography". United States. doi:10.1021/acs.nanolett.7b04024. https://www.osti.gov/servlets/purl/1425485.
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@article{osti_1425485,
title = {Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography},
author = {Hill, Megan O. and Calvo-Almazan, Irene and Allain, Marc and Holt, Martin V. and Ulvestad, Andrew and Treu, Julian and Koblmüller, Gregor and Huang, Chunyi and Huang, Xiaojing and Yan, Hanfei and Nazaretski, Evgeny and Chu, Yong S. and Stephenson, G. Brian and Chamard, Virginie and Lauhon, Lincoln J. and Hruszkewycz, Stephan O.},
abstractNote = {III - As nanowires are candidates for near-infrared light emitters and detectors that can be directly integrated onto silicon. However, nanoscale to microscale variations in structure, composition, and strain within a given nanowire, as well as variations between nanowires, pose challenges to correlating microstructure with device performance. In this work, we utilize coherent nanofocused X-rays to characterize stacking defects and strain in a single InGaAs nanowire supported on Si. By reconstructing diffraction patterns from the 2110 Bragg peak, we show that the lattice orientation varies along the length of the wire, while the strain field along the cross-section is largely unaffected, leaving the band structure unperturbed. Diffraction patterns from the 0110 Bragg peak are reproducibly reconstructed to create three-dimensional images of stacking defects and associated lattice strains, revealing sharp planar boundaries between different crystal phases of wurtzite (WZ) structure that contribute to charge carrier scattering. Phase retrieval is made possible by developing multiangle Bragg projection ptychography (maBPP) to accommodate coherent nanodiffraction patterns measured at arbitrary overlapping positions at multiple angles about a Bragg peak, eliminating the need for scan registration at different angles. The penetrating nature of X-ray radiation, together with the relaxed constraints of maBPP, will enable the in operando imaging of nanowire devices.},
doi = {10.1021/acs.nanolett.7b04024},
journal = {Nano Letters},
issn = {1530-6984},
number = 2,
volume = 18,
place = {United States},
year = {2018},
month = {1}
}
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Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI:  10.1021/acs.nanolett.7b04024
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Cited by: 8 works
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Figures / Tables:

Figure 1 Figure 1: Experimental geometry at HXN beamline (a) SEM image of the investigated InGaAs nanowire. Scale bar is 100 nm. The focused x-ray probe (red circle) is approximately 50 nm in diameter. Scattering geometries used for themore » $01\bar{1}0$ (b) and $2\bar{1}$$\bar{1}0$ (c) conditions. θ$_{Br}$ is the angle of the integrated intensity maximum of the rocking curve. $k^{Br}\atop{i}$ and $k^{Br}\atop{f}$are the initial and final scattering vectors at θ$_{Br}$, defined by the momentum transfer vector G. $k^{∆θj}\atop{i}$ and $k^{∆θj}\atop{f}$ are the initial and final scattering vectors for the jth angle away from θ$_{Br}$, defined by the momentum transfer $q_{j}$,$Q_{θ}$ away from G. (d) The reciprocal space lattice in the radial plane of the nanowire (cyan and red points) and a schematic of the facets of the InGaAs nanowire studied (yellow hexagon). The family of $2\bar{1}$$\bar{1}0$ peaks of the WZ lattice correspond to the 20$\bar{2}$ family of peaks in the ZB structure, and they are sensitive to lattice strain elds within the nanowire. The $01\bar{1}0$ peaks have no analog in the cubic ZB structure. These peaks are sensitive to stacking faults in the WZ phase as well as a component of lattice strain. Bragg ptychography nanodiffraction area raster scans were performed on the same nanowire at the $2\bar{1}$$\bar{1}0$ and $01\bar{1}0$ Bragg peaks and reconstructed into complementary 3D images.« less
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Works referencing / citing this record:

Multimodal X-ray imaging of grain-level properties and performance in a polycrystalline solar cell
journal, May 2019

  • Ulvestad, A.; Hruszkewycz, S. O.; Holt, M. V.
  • Journal of Synchrotron Radiation, Vol. 26, Issue 4
  • DOI: 10.1107/s1600577519003606
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