skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Introduction to Atomistic Modeling for Materials Characterization.

Abstract

Abstract not provided.

Authors:
; ; ; ; ;  [1];  [2]
  1. (UTEP)
  2. (Drexel University)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-CA), Livermore, CA (United States); Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1425311
Report Number(s):
SAND2017-2255C
651325
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the MRS Sprint 2017 held April 17-21, 2017 in Phoenix, AZ.
Country of Publication:
United States
Language:
English

Citation Formats

Zhou, Xiaowang, Lee, Stephen R., Jones, Reese E., Gruber, Jacob, Chavez, Jose Juan, Zubia, David, and Tucker, Garritt. Introduction to Atomistic Modeling for Materials Characterization.. United States: N. p., 2017. Web.
Zhou, Xiaowang, Lee, Stephen R., Jones, Reese E., Gruber, Jacob, Chavez, Jose Juan, Zubia, David, & Tucker, Garritt. Introduction to Atomistic Modeling for Materials Characterization.. United States.
Zhou, Xiaowang, Lee, Stephen R., Jones, Reese E., Gruber, Jacob, Chavez, Jose Juan, Zubia, David, and Tucker, Garritt. Wed . "Introduction to Atomistic Modeling for Materials Characterization.". United States. doi:. https://www.osti.gov/servlets/purl/1425311.
@article{osti_1425311,
title = {Introduction to Atomistic Modeling for Materials Characterization.},
author = {Zhou, Xiaowang and Lee, Stephen R. and Jones, Reese E. and Gruber, Jacob and Chavez, Jose Juan and Zubia, David and Tucker, Garritt},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Mar 01 00:00:00 EST 2017},
month = {Wed Mar 01 00:00:00 EST 2017}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

Save / Share: