Statistical Characterization of Radiation-Induced Pulse Waveforms and Flip-Flop Soft Errors in 14nm Tri-Gate CMOS Using a Back-Sampling Chain (BSC) Technique
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA), Office of Defense Nuclear Nonproliferation
- DOE Contract Number:
- AC52-06NA25396
- OSTI ID:
- 1422917
- Report Number(s):
- LA-UR-18-21118
- Resource Relation:
- Conference: 2017 Symposium on VLSI Technology ; 2017-06-05 - 2017-06-05 ; Kyoto, Japan
- Country of Publication:
- United States
- Language:
- English
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