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Title: Statistical Characterization of Radiation-Induced Pulse Waveforms and Flip-Flop Soft Errors in 14nm Tri-Gate CMOS Using a Back-Sampling Chain (BSC) Technique

Authors:
 [1];  [2];  [1];  [1];  [1];  [1];  [2];  [2];  [2];  [2]; ORCiD logo [3];  [2];  [2];  [2];  [2];  [1]
  1. UMN
  2. Intel
  3. Los Alamos National Laboratory
Publication Date:
Research Org.:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA), Office of Defense Nuclear Nonproliferation (NA-20)
OSTI Identifier:
1422917
Report Number(s):
LA-UR-18-21118
DOE Contract Number:
AC52-06NA25396
Resource Type:
Conference
Resource Relation:
Conference: 2017 Symposium on VLSI Technology ; 2017-06-05 - 2017-06-05 ; Kyoto, Japan
Country of Publication:
United States
Language:
English

Citation Formats

Kumar, Saurabh, Cho, Minki, Everson, Luke, Kim, Hoonki, Tang, Qianying, Mazanec, Paul, Meinerzhagen, Pascal, Malavasi, Andres, Lake, Dan, Tokunaga, Carlos, Quinn, Heather Marie, Khellah, Muhammad, Tschanz, James, Borkar, Shekhar, De, Vivek, and Kim, Chris H. Statistical Characterization of Radiation-Induced Pulse Waveforms and Flip-Flop Soft Errors in 14nm Tri-Gate CMOS Using a Back-Sampling Chain (BSC) Technique. United States: N. p., 2018. Web.
Kumar, Saurabh, Cho, Minki, Everson, Luke, Kim, Hoonki, Tang, Qianying, Mazanec, Paul, Meinerzhagen, Pascal, Malavasi, Andres, Lake, Dan, Tokunaga, Carlos, Quinn, Heather Marie, Khellah, Muhammad, Tschanz, James, Borkar, Shekhar, De, Vivek, & Kim, Chris H. Statistical Characterization of Radiation-Induced Pulse Waveforms and Flip-Flop Soft Errors in 14nm Tri-Gate CMOS Using a Back-Sampling Chain (BSC) Technique. United States.
Kumar, Saurabh, Cho, Minki, Everson, Luke, Kim, Hoonki, Tang, Qianying, Mazanec, Paul, Meinerzhagen, Pascal, Malavasi, Andres, Lake, Dan, Tokunaga, Carlos, Quinn, Heather Marie, Khellah, Muhammad, Tschanz, James, Borkar, Shekhar, De, Vivek, and Kim, Chris H. Tue . "Statistical Characterization of Radiation-Induced Pulse Waveforms and Flip-Flop Soft Errors in 14nm Tri-Gate CMOS Using a Back-Sampling Chain (BSC) Technique". United States. doi:. https://www.osti.gov/servlets/purl/1422917.
@article{osti_1422917,
title = {Statistical Characterization of Radiation-Induced Pulse Waveforms and Flip-Flop Soft Errors in 14nm Tri-Gate CMOS Using a Back-Sampling Chain (BSC) Technique},
author = {Kumar, Saurabh and Cho, Minki and Everson, Luke and Kim, Hoonki and Tang, Qianying and Mazanec, Paul and Meinerzhagen, Pascal and Malavasi, Andres and Lake, Dan and Tokunaga, Carlos and Quinn, Heather Marie and Khellah, Muhammad and Tschanz, James and Borkar, Shekhar and De, Vivek and Kim, Chris H.},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Feb 13 00:00:00 EST 2018},
month = {Tue Feb 13 00:00:00 EST 2018}
}

Conference:
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