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Title: Fabrication of oriented crystals as force measurement tips via focused ion beam and microlithography methods

Abstract

Detailed knowledge of the forces between nanocrystals is very crucial for understanding many generic (e.g., random aggregation/assembly and rheology) and specific (e.g., oriented attachment) phenomena at macroscopic length scales, especially considering the additional complexities involved in nanocrystals such as crystal orientation and corresponding orientation-dependent physicochemical properties. Because there are a limited number of methods to directly measure the forces, little is known about the forces that drive the various emergent phenomena. Here we report on two methods of preparing crystals as force measurement tips used in an atomic force microscope (AFM): the focused ion beam method and microlithography method. The desired crystals are fabricated using these two methods and are fixed to the AFM probe using platinum deposition, ultraviolet epoxy, or resin, which allows for the orientation-dependent force measurements. These two methods can be used to attach virtually any solid particles (from the size of a few hundreds of nanometers to millimeters). We demonstrate the force measurements between aqueous media under different conditions such as pH.

Authors:
 [1]; ORCiD logo [2];  [3]; ORCiD logo [2]
  1. School of Science, North University of China, Shanxi 030051 China
  2. Physical and Computational Sciences Directorate, Pacific Northwest National Laboratory, WA USA
  3. Energy and Environment Directorate, Pacific Northwest National Laboratory, WA USA
Publication Date:
Research Org.:
Pacific Northwest National Laboratory (PNNL), Richland, WA (US), Environmental Molecular Sciences Laboratory (EMSL); Energy Frontier Research Centers (EFRC) (United States). Interfacial Dynamics in Radioactive Environments and Materials (IDREAM)
Sponsoring Org.:
USDOE
OSTI Identifier:
1422297
Report Number(s):
PNNL-SA-126666
Journal ID: ISSN 0142-2421; 49686
DOE Contract Number:  
AC05-76RL01830
Resource Type:
Journal Article
Journal Name:
Surface and Interface Analysis
Additional Journal Information:
Journal Volume: 50; Journal Issue: 1; Journal ID: ISSN 0142-2421
Publisher:
Wiley
Country of Publication:
United States
Language:
English
Subject:
focused ion beam; force measurement; microlithography; tip fabrication; Environmental Molecular Sciences Laboratory

Citation Formats

Wu, Zhigang, Chun, Jaehun, Chatterjee, Sayandev, and Li, Dongsheng. Fabrication of oriented crystals as force measurement tips via focused ion beam and microlithography methods. United States: N. p., 2017. Web. doi:10.1002/sia.6346.
Wu, Zhigang, Chun, Jaehun, Chatterjee, Sayandev, & Li, Dongsheng. Fabrication of oriented crystals as force measurement tips via focused ion beam and microlithography methods. United States. doi:10.1002/sia.6346.
Wu, Zhigang, Chun, Jaehun, Chatterjee, Sayandev, and Li, Dongsheng. Thu . "Fabrication of oriented crystals as force measurement tips via focused ion beam and microlithography methods". United States. doi:10.1002/sia.6346.
@article{osti_1422297,
title = {Fabrication of oriented crystals as force measurement tips via focused ion beam and microlithography methods},
author = {Wu, Zhigang and Chun, Jaehun and Chatterjee, Sayandev and Li, Dongsheng},
abstractNote = {Detailed knowledge of the forces between nanocrystals is very crucial for understanding many generic (e.g., random aggregation/assembly and rheology) and specific (e.g., oriented attachment) phenomena at macroscopic length scales, especially considering the additional complexities involved in nanocrystals such as crystal orientation and corresponding orientation-dependent physicochemical properties. Because there are a limited number of methods to directly measure the forces, little is known about the forces that drive the various emergent phenomena. Here we report on two methods of preparing crystals as force measurement tips used in an atomic force microscope (AFM): the focused ion beam method and microlithography method. The desired crystals are fabricated using these two methods and are fixed to the AFM probe using platinum deposition, ultraviolet epoxy, or resin, which allows for the orientation-dependent force measurements. These two methods can be used to attach virtually any solid particles (from the size of a few hundreds of nanometers to millimeters). We demonstrate the force measurements between aqueous media under different conditions such as pH.},
doi = {10.1002/sia.6346},
journal = {Surface and Interface Analysis},
issn = {0142-2421},
number = 1,
volume = 50,
place = {United States},
year = {2017},
month = {11}
}

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