Estimation of Drug Particle Size in Intact Tablets by 2-Dimensional X-Ray Diffractometry

doi:10.1016/j.xphs.2017.08.021

Title: Estimation of Drug Particle Size in Intact Tablets by 2-Dimensional X-Ray Diffractometry

Full Record
Other Related Research

Authors:: Thakral, Seema; Thakral, Naveen K.; Suryanarayanan, Raj

Publication Date:: Mon Jan 01 00:00:00 EST 2018

Research Org.:: Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)

Sponsoring Org.:: DOE - BASIC ENERGY SCIENCESNSF

OSTI Identifier:: 1422228

Resource Type:: Journal Article

Resource Relation:: Journal Name: Journal of Pharmaceutical Sciences; Journal Volume: 107; Journal Issue: 1

Country of Publication:: United States

Language:: ENGLISH

Citation Formats


                    Thakral, Seema, Thakral, Naveen K., and Suryanarayanan, Raj. Estimation of Drug Particle Size in Intact Tablets by 2-Dimensional X-Ray Diffractometry.  United States: N. p., 2018. 
        Web.  doi:10.1016/j.xphs.2017.08.021.

Copy to clipboard


                    Thakral, Seema, Thakral, Naveen K., & Suryanarayanan, Raj. Estimation of Drug Particle Size in Intact Tablets by 2-Dimensional X-Ray Diffractometry.  United States.  doi:10.1016/j.xphs.2017.08.021.

Copy to clipboard


                    Thakral, Seema, Thakral, Naveen K., and Suryanarayanan, Raj. Mon .  
        "Estimation of Drug Particle Size in Intact Tablets by 2-Dimensional X-Ray Diffractometry".  United States.  
        doi:10.1016/j.xphs.2017.08.021.

Copy to clipboard


                    
@article{osti_1422228,

  title        = {Estimation of Drug Particle Size in Intact Tablets by 2-Dimensional X-Ray Diffractometry},

  author       = {Thakral, Seema and Thakral, Naveen K. and Suryanarayanan, Raj},

  abstractNote = {},

  doi          = {10.1016/j.xphs.2017.08.021},

  journal      = {Journal of Pharmaceutical Sciences},

  number       = 1,

  volume       = 107,

  place        = {United States},

  year         = {Mon Jan 01 00:00:00 EST 2018},

  month        = {Mon Jan 01 00:00:00 EST 2018}

}

Copy to clipboard

Journal Article:

DOI: 10.1016/j.xphs.2017.08.021

Other availability

Find in Google Scholar

Search WorldCat to find libraries that may hold this journal

Save / Share:

Export Metadata

Save to My Library

Similar records in OSTI.GOV collections:

Compression-Induced Crystallization of Amorphous Indomethacin in Tablets: Characterization of Spatial Heterogeneity by Two-Dimensional X-ray Diffractometry

Journal Article Thakral, Naveen K. ; Mohapatra, Sarat ; Stephenson, Gregory A. ; ... - Mol. Pharmaceutics
DOI: 10.1021/mp5005788
Spatial Distribution of Trehalose Dihydrate Crystallization in Tablets by X-ray Diffractometry

Journal Article Thakral, Naveen K. ; Yamada, Hiroyuki ; Stephenson, Gregory A. ; ... - Mol. Pharmaceutics
DOI: 10.1021/acs.molpharmaceut.5b00567
Investigation of Spatial Heterogeneity of Salt Disproportionation in Tablets by Synchrotron X-ray Diffractometry

Journal Article Koranne, Sampada ; Govindarajan, Ramprakash ; Suryanarayanan, Raj - Molecular Pharmaceutics
DOI: 10.1021/acs.molpharmaceut.6b01052
Raman scattering and x-ray diffractometry studies of epitaxial TiO[sub 2] and VO[sub 2] thin films and multilayers on [alpha]-Al[sub 2]O[sub 3](11[bar 2]0)

Journal Article Foster, C.M. ; Chiarello, R.P. ; Chang, H.L.M. ; ... - Journal of Applied Physics; (United States)

Epitaxial thin films of TiO[sub 2] and VO[sub 2] single layers and TiO[sub 2]/VO[sub 2] multilayers were grown on (11[bar 2]0) sapphire ([alpha]-Al[sub 2]O[sub 3]) substrates using the metalorganic chemical vapor deposition technique and were characterized using Raman scattering and four-circle x-ray diffractometry. X-ray diffraction results indicate that the films are high quality single crystal material with well defined growth plane and small in-plane and out-of-plane mosaic. Single-layer films are shown to obey the Raman selection rules of TiO[sub 2] and VO[sub 2] single crystals. The close adherence to the Raman selection rules indicates the high degree of orientation ofmore »« less
DOI: 10.1063/1.353036
Low-temperature structural phase transition in ZrO[sub 2]-12 mol% CeO[sub 2] studied by infrared spectroscopy and x-ray diffractometry

Journal Article Hirata, Toshiya ; Furubayashi, Takao ; Nakatani, Isao ; ... - Journal of the American Ceramic Society; (United States)

The low-temperature tetragonal (t) to monoclinic (m) phase transition in ZrO[sub 2]-12 mol% CeO[sub 2] was studied by Fourier-transform infrared spectroscopy and X-ray diffractometry (XRD). When the ZrO[sub 2]-12 mol% CeO[sub 2] was cooled, the t [r arrow] m phase transition occurred at about 120K; this caused significant changes in the infrared reflectance spectra and X-ray diffractograms. As the phase transition proceeded, difference spectra' obtained by subtracting the infrared spectra before and after the phase transition revealed two infrared modes at 575 and 740 cm[sup [minus]1] which were assigned to the m phase. The volume fraction of the m phasemore »« less
DOI: 10.1111/j.1151-2916.1993.tb03767.x

Similar Records