Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications

Huang, Xian -Rong; Gog, Thomas; Kim, Jungho; Kasman, Elina; Said, Ayman H.; Casa, Diego M.; Wieczorek, Michael; Honnicke, Marcelo G.; Assoufid, Lahsen

doi:10.1107/S1600576717018155

Title: Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications

Journal Article · Thu Feb 01 00:00:00 EST 2018 · Journal of Applied Crystallography (Online)

DOI:https://doi.org/10.1107/S1600576717018155· OSTI ID:1421955

Huang, Xian -Rong ^[1]; Gog, Thomas ^[1]; Kim, Jungho ^[1]; Kasman, Elina ^[1]; Said, Ayman H. ^[1]; Casa, Diego M. ^[1];

^[1]; Honnicke, Marcelo G. ^[2]; Assoufid, Lahsen ^[1]

Argonne National Lab. (ANL), Argonne, IL (United States)
Univ. Federal da Integracao Latino-Americana, Parana (Brazil)

Quartz has hundreds of strong Bragg reflections that may offer a great number of choices for making fixed-angle X-ray analyzers and polarizers at virtually any hard X-ray energies with selectable resolution. However, quartz crystals, unlike silicon and germanium, are chiral and may thus appear in two different forms of handedness that are mirror images. Furthermore, because of the threefold rotational symmetry along thecaxis, the {h₁h₂h₃L} and {h₂h₁h₃L} Bragg reflections may have quite different Darwin bandwidth, reflectivity and angular acceptance, although they have the same Bragg angle. The design of X-ray optics from quartz crystals therefore requires unambiguous determination of the orientation, handedness and polarity of the crystals. The Laue method and single-axis diffraction technique can provide such information, but the variety of conventions used in the literature to describe quartz structures has caused widespread confusion. The current studies give detailed guidelines for design and fabrication of quartz X-ray optics, with special emphasis on the correct interpretation of Laue patterns in terms of the crystallography and diffraction properties of quartz. Furthermore, the quartz crystals examined were confirmed by X-ray topography to have acceptably low densities of dislocations and other defects, which is the foundation for developing high-resolution quartz-based X-ray optics.

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Research Organization:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 1421955

Journal Information:: Journal of Applied Crystallography (Online), Vol. 51, Issue 1; ISSN 1600-5767

Publisher:: International Union of CrystallographyCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 10 works

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Cited By (5)

X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering? Hönnicke, Marcelo Goncalves; Cusatis, Cesar; Conley, Raymond Journal of Applied Crystallography, Vol. 52, Issue 6 https://doi.org/10.1107/s1600576719012925	journal	October 2019
Confusion over the description of the quartz structure yet again Glazer, A. M. Journal of Applied Crystallography, Vol. 51, Issue 3 https://doi.org/10.1107/s160057671800434x	journal	April 2018
Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications. Corrigendum Huang, Xian-Rong; Gog, Thomas; Kim, Jungho Journal of Applied Crystallography, Vol. 51, Issue 3 https://doi.org/10.1107/s1600576718004363	journal	April 2018
On evaluating x-ray imaging crystals with synchrotron radiation Pereira, N. R.; Macrander, A. T.; Stoeckl, C. Review of Scientific Instruments, Vol. 89, Issue 10 https://doi.org/10.1063/1.5045569	journal	October 2018
Modeling of energy-dispersive X-ray diffraction for high-symmetry crystal orientation Dragoi, Danut; Dragoi, Alexandru Acta Crystallographica Section A Foundations and Advances, Vol. 75, Issue 1 https://doi.org/10.1107/s2053273318013864	journal	January 2019

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36 MATERIALS SCIENCE
Bragg reflection
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