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Title: Applications of Electron Channeling Contrast Imaging (ECCI) in Failure Analysis of In-Situ Synchrotron X-Ray Diffraction Deformation Experiments

Authors:
;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
DOE - BASIC ENERGY SCIENCESNSF
OSTI Identifier:
1420985
Resource Type:
Journal Article
Resource Relation:
Journal Name: Microscopy and Microanalysis; Journal Volume: 23; Journal Issue: S1
Country of Publication:
United States
Language:
ENGLISH

Citation Formats

Kaboli, Shirin, and Burnley, Pamela C. Applications of Electron Channeling Contrast Imaging (ECCI) in Failure Analysis of In-Situ Synchrotron X-Ray Diffraction Deformation Experiments. United States: N. p., 2017. Web. doi:10.1017/S143192761700352X.
Kaboli, Shirin, & Burnley, Pamela C. Applications of Electron Channeling Contrast Imaging (ECCI) in Failure Analysis of In-Situ Synchrotron X-Ray Diffraction Deformation Experiments. United States. doi:10.1017/S143192761700352X.
Kaboli, Shirin, and Burnley, Pamela C. Sat . "Applications of Electron Channeling Contrast Imaging (ECCI) in Failure Analysis of In-Situ Synchrotron X-Ray Diffraction Deformation Experiments". United States. doi:10.1017/S143192761700352X.
@article{osti_1420985,
title = {Applications of Electron Channeling Contrast Imaging (ECCI) in Failure Analysis of In-Situ Synchrotron X-Ray Diffraction Deformation Experiments},
author = {Kaboli, Shirin and Burnley, Pamela C.},
abstractNote = {},
doi = {10.1017/S143192761700352X},
journal = {Microscopy and Microanalysis},
number = S1,
volume = 23,
place = {United States},
year = {Sat Jul 01 00:00:00 EDT 2017},
month = {Sat Jul 01 00:00:00 EDT 2017}
}