skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Applications of Electron Channeling Contrast Imaging (ECCI) in Failure Analysis of In-Situ Synchrotron X-Ray Diffraction Deformation Experiments

Authors:
;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
DOE - BASIC ENERGY SCIENCESNSF
OSTI Identifier:
1420985
Resource Type:
Journal Article
Journal Name:
Microscopy and Microanalysis
Additional Journal Information:
Journal Volume: 23; Journal Issue: S1; Journal ID: ISSN 1431-9276
Publisher:
Microscopy Society of America (MSA)
Country of Publication:
United States
Language:
ENGLISH

Citation Formats

Kaboli, Shirin, and Burnley, Pamela C. Applications of Electron Channeling Contrast Imaging (ECCI) in Failure Analysis of In-Situ Synchrotron X-Ray Diffraction Deformation Experiments. United States: N. p., 2017. Web. doi:10.1017/S143192761700352X.
Kaboli, Shirin, & Burnley, Pamela C. Applications of Electron Channeling Contrast Imaging (ECCI) in Failure Analysis of In-Situ Synchrotron X-Ray Diffraction Deformation Experiments. United States. doi:10.1017/S143192761700352X.
Kaboli, Shirin, and Burnley, Pamela C. Sat . "Applications of Electron Channeling Contrast Imaging (ECCI) in Failure Analysis of In-Situ Synchrotron X-Ray Diffraction Deformation Experiments". United States. doi:10.1017/S143192761700352X.
@article{osti_1420985,
title = {Applications of Electron Channeling Contrast Imaging (ECCI) in Failure Analysis of In-Situ Synchrotron X-Ray Diffraction Deformation Experiments},
author = {Kaboli, Shirin and Burnley, Pamela C.},
abstractNote = {},
doi = {10.1017/S143192761700352X},
journal = {Microscopy and Microanalysis},
issn = {1431-9276},
number = S1,
volume = 23,
place = {United States},
year = {2017},
month = {7}
}

Works referenced in this record:

The deformation-DIA: A new apparatus for high temperature triaxial deformation to pressures up to 15 GPa
journal, June 2003

  • Wang, Yanbin; Durham, William B.; Getting, Ivan C.
  • Review of Scientific Instruments, Vol. 74, Issue 6
  • DOI: 10.1063/1.1570948

Slip and twinning dislocations in sapphire (α-Al 2 O 3 )
journal, September 1998