skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Analysis of TID Process Geometry and Bias Condition Dependence of 14-nm FinFETs and Implications for RF and SRAM Performance.

Abstract

Abstract not provided.

Authors:
; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1420867
Report Number(s):
SAND2016-4642C
Journal ID: ISSN 0018--9499; 640453
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Journal Volume: 64; Journal Issue: 1; Conference: Proposed for presentation at the DTRA/NRO Review.
Country of Publication:
United States
Language:
English

Citation Formats

King, Michael Patrick, Wu, Kevin, Eller, M., Samavedam, S., Draper, Bruce L., Meisenheimer, Timothy L., Zhang, E., Shetler, K. J., Haeffner, T. D., and Massengill, Lloyd W. Analysis of TID Process Geometry and Bias Condition Dependence of 14-nm FinFETs and Implications for RF and SRAM Performance.. United States: N. p., 2016. Web. doi:10.1109/TNS.2016.2634538.
King, Michael Patrick, Wu, Kevin, Eller, M., Samavedam, S., Draper, Bruce L., Meisenheimer, Timothy L., Zhang, E., Shetler, K. J., Haeffner, T. D., & Massengill, Lloyd W. Analysis of TID Process Geometry and Bias Condition Dependence of 14-nm FinFETs and Implications for RF and SRAM Performance.. United States. doi:10.1109/TNS.2016.2634538.
King, Michael Patrick, Wu, Kevin, Eller, M., Samavedam, S., Draper, Bruce L., Meisenheimer, Timothy L., Zhang, E., Shetler, K. J., Haeffner, T. D., and Massengill, Lloyd W. Sun . "Analysis of TID Process Geometry and Bias Condition Dependence of 14-nm FinFETs and Implications for RF and SRAM Performance.". United States. doi:10.1109/TNS.2016.2634538. https://www.osti.gov/servlets/purl/1420867.
@article{osti_1420867,
title = {Analysis of TID Process Geometry and Bias Condition Dependence of 14-nm FinFETs and Implications for RF and SRAM Performance.},
author = {King, Michael Patrick and Wu, Kevin and Eller, M. and Samavedam, S. and Draper, Bruce L. and Meisenheimer, Timothy L. and Zhang, E. and Shetler, K. J. and Haeffner, T. D. and Massengill, Lloyd W.},
abstractNote = {Abstract not provided.},
doi = {10.1109/TNS.2016.2634538},
journal = {},
issn = {0018--9499},
number = 1,
volume = 64,
place = {United States},
year = {2016},
month = {5}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

Save / Share:

Works referencing / citing this record:

FCC-ee: The Lepton Collider: Future Circular Collider Conceptual Design Report Volume 2
journal, June 2019

  • Abada, A.; Abbrescia, M.; AbdusSalam, S. S.
  • The European Physical Journal Special Topics, Vol. 228, Issue 2
  • DOI: 10.1140/epjst/e2019-900045-4

FCC-hh: The Hadron Collider: Future Circular Collider Conceptual Design Report Volume 3
journal, July 2019

  • Abada, A.; Abbrescia, M.; AbdusSalam, S. S.
  • The European Physical Journal Special Topics, Vol. 228, Issue 4
  • DOI: 10.1140/epjst/e2019-900087-0