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Title: Quantitative measurements of shear displacement using atomic force microscopy

Authors:
 [1];  [2];  [2]; ORCiD logo [1]
  1. Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854, USA
  2. Department of Physics and State Key Laboratory of Low-Dimensional Quantum Physics, Tsinghua University, Beijing 100084, People's Republic of China
Publication Date:
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1420602
Grant/Contract Number:  
SC0008147
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Name: Applied Physics Letters Journal Volume: 108 Journal Issue: 12; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Wang, Wenbo, Sun, Ying, Zhao, Yonggang, and Wu, Weida. Quantitative measurements of shear displacement using atomic force microscopy. United States: N. p., 2016. Web. doi:10.1063/1.4944799.
Wang, Wenbo, Sun, Ying, Zhao, Yonggang, & Wu, Weida. Quantitative measurements of shear displacement using atomic force microscopy. United States. doi:10.1063/1.4944799.
Wang, Wenbo, Sun, Ying, Zhao, Yonggang, and Wu, Weida. Mon . "Quantitative measurements of shear displacement using atomic force microscopy". United States. doi:10.1063/1.4944799.
@article{osti_1420602,
title = {Quantitative measurements of shear displacement using atomic force microscopy},
author = {Wang, Wenbo and Sun, Ying and Zhao, Yonggang and Wu, Weida},
abstractNote = {},
doi = {10.1063/1.4944799},
journal = {Applied Physics Letters},
number = 12,
volume = 108,
place = {United States},
year = {Mon Mar 21 00:00:00 EDT 2016},
month = {Mon Mar 21 00:00:00 EDT 2016}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1063/1.4944799

Citation Metrics:
Cited by: 2 works
Citation information provided by
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Works referenced in this record:

Piezoresponse force microscopy (PFM)
journal, November 2011