Correlated rattling-ion origins of dielectric properties in reentrant dipole glasses BaTiO3-BiScO3

Krayzman, Victor; Levin, Igor; Woicik, Joseph C.; Bridges, Frank

doi:10.1063/1.4935417

Title: Correlated rattling-ion origins of dielectric properties in reentrant dipole glasses BaTiO3-BiScO3

Journal Article · Mon Nov 09 00:00:00 EST 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4935417· OSTI ID:1420598

Krayzman, Victor; Levin, Igor; Woicik, Joseph C.; Bridges, Frank

The local structure of the pseudo-cubic solid solution 0.6BaTiO3-0.4BiScO3, which exhibits reentrant dipole-glass behavior, has been determined using the Reverse Monte Carlo method to simultaneously fit (1) neutron and X-ray total scattering data (including the corresponding real-space pair-distribution functions), (2) Bi and Sc extended X-ray absorption fine structure, and (3) patterns of diffuse scattering in electron diffraction. These structural refinements revealed the multi-site probability density distributions for both Bi (14-sites) and Ti (8 sites), whereas Ba and Sc featured normal unimodal distributions. Bi atoms are displaced along both the 〈111〉 and 〈100〉 directions, while Ti atoms are shifted along 〈111〉. Correlated dynamic hopping of Bi and Ti over their corresponding split sites combined with chemical disorder is proposed as the origin of the strong frequency dispersion observed in dielectric measurements. The existence of split sites also explains the reentrant dipole-glass behavior reported for this system.

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Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-98CH10886

OSTI ID:: 1420598

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Vol. 107 Journal Issue: 19; ISSN 0003-6951

Publisher:: American Institute of PhysicsCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 33 works

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References (34)

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