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Title: Note: Narrow x-ray reflections are easier to locate with sandpaper

Authors:
ORCiD logo [1];  [2]
  1. Ecopulse, Inc., 7844 Vervain Ct, Springfield, Virginia 22152, USA
  2. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1420019
Grant/Contract Number:
AC02- 06CH11357
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 89; Journal Issue: 2; Related Information: CHORUS Timestamp: 2018-02-09 11:18:58; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Pereira, N. R., and Macrander, A. T. Note: Narrow x-ray reflections are easier to locate with sandpaper. United States: N. p., 2018. Web. doi:10.1063/1.5019463.
Pereira, N. R., & Macrander, A. T. Note: Narrow x-ray reflections are easier to locate with sandpaper. United States. doi:10.1063/1.5019463.
Pereira, N. R., and Macrander, A. T. 2018. "Note: Narrow x-ray reflections are easier to locate with sandpaper". United States. doi:10.1063/1.5019463.
@article{osti_1420019,
title = {Note: Narrow x-ray reflections are easier to locate with sandpaper},
author = {Pereira, N. R. and Macrander, A. T.},
abstractNote = {},
doi = {10.1063/1.5019463},
journal = {Review of Scientific Instruments},
number = 2,
volume = 89,
place = {United States},
year = 2018,
month = 2
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on February 9, 2019
Publisher's Accepted Manuscript

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