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Title: Characterization of an Ionization Readout Tile for nEXO

Authors:
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Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States); Brookhaven National Lab. (BNL), Upton, NY (United States); Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Nuclear Physics (NP); USDOE Office of Science (SC), High Energy Physics (HEP); USDOE National Nuclear Security Administration (NNSA)
Contributing Org.:
nEXO Collaboration
OSTI Identifier:
1419988
Alternate Identifier(s):
OSTI ID: 1476280; OSTI ID: 1525727
Report Number(s):
BNL-209138-2018-JAAM; LLNL-JRNL-759460
Journal ID: ISSN 1748-0221; TRN: US1801436
Grant/Contract Number:  
AC02-76SF00515; SC0012704; AC52-07NA27344
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Instrumentation
Additional Journal Information:
Journal Volume: 13; Journal Issue: 01; Journal ID: ISSN 1748-0221
Publisher:
Institute of Physics (IOP)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; nEXO; Double beta decay; 136Xe

Citation Formats

Jewell, M., Schubert, A., Cen, W. R., Dalmasson, J., DeVoe, R., Fabris, L., Gratta, G., Jamil, A., Li, G., Odian, A., Patel, M., Pocar, A., Qiu, D., Wang, Q., Wen, L. J., Albert, J. B., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P., Beck, D., Belov, V., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, G. F., Cao, L., Chambers, C., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Cree, W., Côté, M., Daniels, T., Daugherty, S. J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. Der, Didberidze, T., Dilling, J., Ding, Y. Y., Dolinski, M. J., Dragone, A., Fairbank, W., Farine, J., Feyzbakhsh, S., Fontaine, R., Fudenberg, D., Giacomini, G., Gornea, R., Hansen, E. V., Harris, D., Hasan, M., Heffner, M., Hoppe, E. W., House, A., Hufschmidt, P., Hughes, M., Hößl, J., Ito, Y., Iverson, A., Jiang, X. S., Johnston, S., Karelin, A., Kaufman, L. J., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Leonard, D. S., Li, S., Li, Z., Licciardi, C., Lin, Y. H., MacLellan, R., Michel, T., Mong, B., Moore, D., Murray, K., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Odgers, K., Oriunno, M., Orrell, J. L., Ostrovskiy, I., Overman, C. T., Ortega, G. S., Parent, S., Piepke, A., Pratte, J. -F., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retiere, F., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Sinclair, D., Skarpaas, K., Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X. L., Tarka, M., Todd, J., Tolba, T., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Visser, G., Vuilleumier, J. -L., Wagenpfeil, M., Weber, M., Wei, W., Wichoski, U., Wrede, G., Wu, S. X., Wu, W. H., Yang, L., Yen, Y. -R., Zeldovich, O., Zhang, X., Zhao, J., Zhou, Y., and Ziegler, T. Characterization of an Ionization Readout Tile for nEXO. United States: N. p., 2018. Web. doi:10.1088/1748-0221/13/01/P01006.
Jewell, M., Schubert, A., Cen, W. R., Dalmasson, J., DeVoe, R., Fabris, L., Gratta, G., Jamil, A., Li, G., Odian, A., Patel, M., Pocar, A., Qiu, D., Wang, Q., Wen, L. J., Albert, J. B., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P., Beck, D., Belov, V., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, G. F., Cao, L., Chambers, C., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Cree, W., Côté, M., Daniels, T., Daugherty, S. J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. Der, Didberidze, T., Dilling, J., Ding, Y. Y., Dolinski, M. J., Dragone, A., Fairbank, W., Farine, J., Feyzbakhsh, S., Fontaine, R., Fudenberg, D., Giacomini, G., Gornea, R., Hansen, E. V., Harris, D., Hasan, M., Heffner, M., Hoppe, E. W., House, A., Hufschmidt, P., Hughes, M., Hößl, J., Ito, Y., Iverson, A., Jiang, X. S., Johnston, S., Karelin, A., Kaufman, L. J., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Leonard, D. S., Li, S., Li, Z., Licciardi, C., Lin, Y. H., MacLellan, R., Michel, T., Mong, B., Moore, D., Murray, K., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Odgers, K., Oriunno, M., Orrell, J. L., Ostrovskiy, I., Overman, C. T., Ortega, G. S., Parent, S., Piepke, A., Pratte, J. -F., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retiere, F., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Sinclair, D., Skarpaas, K., Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X. L., Tarka, M., Todd, J., Tolba, T., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Visser, G., Vuilleumier, J. -L., Wagenpfeil, M., Weber, M., Wei, W., Wichoski, U., Wrede, G., Wu, S. X., Wu, W. H., Yang, L., Yen, Y. -R., Zeldovich, O., Zhang, X., Zhao, J., Zhou, Y., & Ziegler, T. Characterization of an Ionization Readout Tile for nEXO. United States. https://doi.org/10.1088/1748-0221/13/01/P01006
Jewell, M., Schubert, A., Cen, W. R., Dalmasson, J., DeVoe, R., Fabris, L., Gratta, G., Jamil, A., Li, G., Odian, A., Patel, M., Pocar, A., Qiu, D., Wang, Q., Wen, L. J., Albert, J. B., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P., Beck, D., Belov, V., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, G. F., Cao, L., Chambers, C., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Cree, W., Côté, M., Daniels, T., Daugherty, S. J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. Der, Didberidze, T., Dilling, J., Ding, Y. Y., Dolinski, M. J., Dragone, A., Fairbank, W., Farine, J., Feyzbakhsh, S., Fontaine, R., Fudenberg, D., Giacomini, G., Gornea, R., Hansen, E. V., Harris, D., Hasan, M., Heffner, M., Hoppe, E. W., House, A., Hufschmidt, P., Hughes, M., Hößl, J., Ito, Y., Iverson, A., Jiang, X. S., Johnston, S., Karelin, A., Kaufman, L. J., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Leonard, D. S., Li, S., Li, Z., Licciardi, C., Lin, Y. H., MacLellan, R., Michel, T., Mong, B., Moore, D., Murray, K., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Odgers, K., Oriunno, M., Orrell, J. L., Ostrovskiy, I., Overman, C. T., Ortega, G. S., Parent, S., Piepke, A., Pratte, J. -F., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retiere, F., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Sinclair, D., Skarpaas, K., Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X. L., Tarka, M., Todd, J., Tolba, T., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Visser, G., Vuilleumier, J. -L., Wagenpfeil, M., Weber, M., Wei, W., Wichoski, U., Wrede, G., Wu, S. X., Wu, W. H., Yang, L., Yen, Y. -R., Zeldovich, O., Zhang, X., Zhao, J., Zhou, Y., and Ziegler, T. 2018. "Characterization of an Ionization Readout Tile for nEXO". United States. https://doi.org/10.1088/1748-0221/13/01/P01006. https://www.osti.gov/servlets/purl/1419988.
@article{osti_1419988,
title = {Characterization of an Ionization Readout Tile for nEXO},
author = {Jewell, M. and Schubert, A. and Cen, W. R. and Dalmasson, J. and DeVoe, R. and Fabris, L. and Gratta, G. and Jamil, A. and Li, G. and Odian, A. and Patel, M. and Pocar, A. and Qiu, D. and Wang, Q. and Wen, L. J. and Albert, J. B. and Anton, G. and Arnquist, I. J. and Badhrees, I. and Barbeau, P. and Beck, D. and Belov, V. and Bourque, F. and Brodsky, J. P. and Brown, E. and Brunner, T. and Burenkov, A. and Cao, G. F. and Cao, L. and Chambers, C. and Charlebois, S. A. and Chiu, M. and Cleveland, B. and Coon, M. and Craycraft, A. and Cree, W. and Côté, M. and Daniels, T. and Daugherty, S. J. and Daughhetee, J. and Delaquis, S. and Mesrobian-Kabakian, A. Der and Didberidze, T. and Dilling, J. and Ding, Y. Y. and Dolinski, M. J. and Dragone, A. and Fairbank, W. and Farine, J. and Feyzbakhsh, S. and Fontaine, R. and Fudenberg, D. and Giacomini, G. and Gornea, R. and Hansen, E. V. and Harris, D. and Hasan, M. and Heffner, M. and Hoppe, E. W. and House, A. and Hufschmidt, P. and Hughes, M. and Hößl, J. and Ito, Y. and Iverson, A. and Jiang, X. S. and Johnston, S. and Karelin, A. and Kaufman, L. J. and Koffas, T. and Kravitz, S. and Krücken, R. and Kuchenkov, A. and Kumar, K. S. and Lan, Y. and Leonard, D. S. and Li, S. and Li, Z. and Licciardi, C. and Lin, Y. H. and MacLellan, R. and Michel, T. and Mong, B. and Moore, D. and Murray, K. and Newby, R. J. and Ning, Z. and Njoya, O. and Nolet, F. and Odgers, K. and Oriunno, M. and Orrell, J. L. and Ostrovskiy, I. and Overman, C. T. and Ortega, G. S. and Parent, S. and Piepke, A. and Pratte, J. -F. and Radeka, V. and Raguzin, E. and Rao, T. and Rescia, S. and Retiere, F. and Robinson, A. and Rossignol, T. and Rowson, P. C. and Roy, N. and Saldanha, R. and Sangiorgio, S. and Schmidt, S. and Schneider, J. and Sinclair, D. and Skarpaas, K. and Soma, A. K. and St-Hilaire, G. and Stekhanov, V. and Stiegler, T. and Sun, X. L. and Tarka, M. and Todd, J. and Tolba, T. and Tsang, R. and Tsang, T. and Vachon, F. and Veeraraghavan, V. and Visser, G. and Vuilleumier, J. -L. and Wagenpfeil, M. and Weber, M. and Wei, W. and Wichoski, U. and Wrede, G. and Wu, S. X. and Wu, W. H. and Yang, L. and Yen, Y. -R. and Zeldovich, O. and Zhang, X. and Zhao, J. and Zhou, Y. and Ziegler, T.},
abstractNote = {},
doi = {10.1088/1748-0221/13/01/P01006},
url = {https://www.osti.gov/biblio/1419988}, journal = {Journal of Instrumentation},
issn = {1748-0221},
number = 01,
volume = 13,
place = {United States},
year = {Wed Jan 10 00:00:00 EST 2018},
month = {Wed Jan 10 00:00:00 EST 2018}
}

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Figures / Tables:

Figure 1 Figure 1: Diagram of the integration scheme of charge tiles into the nEXO LXe TPC. The anode is composed of a mosaic of many adjacent charge tiles. Also shown on the outer edge of the copper TPC are UV-sensitive silicon photomultipliers (SiPMs), the proposed method for detecting the LXe scintillationmore » light.« less

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Geant4 developments and applications
journal, February 2006


Enhancement of NEST capabilities for simulating low-energy recoils in liquid xenon
journal, October 2013


Correlated fluctuations between luminescence and ionization in liquid xenon
journal, August 2003


Liquid xenon detectors for particle physics and astrophysics
journal, July 2010


Works referencing / citing this record: