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Title: Characterization of an Ionization Readout Tile for nEXO

Abstract

Here, a new design for the anode of a time projection chamber, consisting of a charge-detecting "tile", is investigated for use in large scale liquid xenon detectors. The tile is produced by depositing 60 orthogonal metal charge-collecting strips, 3 mm wide, on a 10 cm × 10 cm fused-silica wafer. These charge tiles may be employed by large detectors, such as the proposed tonne-scale nEXO experiment to search for neutrinoless double-beta decay. Modular by design, an array of tiles can cover a sizable area. The width of each strip is small compared to the size of the tile, so a Frisch grid is not required. A grid-less, tiled anode design is beneficial for an experiment such as nEXO, where a wire tensioning support structure and Frisch grid might contribute radioactive backgrounds and would have to be designed to accommodate cycling to cryogenic temperatures. The segmented anode also reduces some degeneracies in signal reconstruction that arise in large-area crossed-wire time projection chambers. A prototype tile was tested in a cell containing liquid xenon. Very good agreement is achieved between the measured ionization spectrum of a 207Bi source and simulations that include the microphysics of recombination in xenon and a detailed modelingmore » of the electrostatic field of the detector. An energy resolution σ/ E=5.5% is observed at 570 keV, comparable to the best intrinsic ionization-only resolution reported in literature for liquid xenon at 936 V/cm.« less

Authors:
; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; more »; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; « less
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE
Contributing Org.:
nEXO Collaboration
OSTI Identifier:
1419988
Grant/Contract Number:
AC02-76SF00515
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Instrumentation
Additional Journal Information:
Journal Volume: 13; Journal Issue: 01; Journal ID: ISSN 1748-0221
Publisher:
Institute of Physics (IOP)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; nEXO; Double beta decay; 136Xe

Citation Formats

Jewell, M., Schubert, A., Cen, W. R., Dalmasson, J., DeVoe, R., Fabris, L., Gratta, G., Jamil, A., Li, G., Odian, A., Patel, M., Pocar, A., Qiu, D., Wang, Q., Wen, L. J., Albert, J. B., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P., Beck, D., Belov, V., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, G. F., Cao, L., Chambers, C., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Cree, W., Côté, M., Daniels, T., Daugherty, S. J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. Der, Didberidze, T., Dilling, J., Ding, Y. Y., Dolinski, M. J., Dragone, A., Fairbank, W., Farine, J., Feyzbakhsh, S., Fontaine, R., Fudenberg, D., Giacomini, G., Gornea, R., Hansen, E. V., Harris, D., Hasan, M., Heffner, M., Hoppe, E. W., House, A., Hufschmidt, P., Hughes, M., Hößl, J., Ito, Y., Iverson, A., Jiang, X. S., Johnston, S., Karelin, A., Kaufman, L. J., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Leonard, D. S., Li, S., Li, Z., Licciardi, C., Lin, Y. H., MacLellan, R., Michel, T., Mong, B., Moore, D., Murray, K., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Odgers, K., Oriunno, M., Orrell, J. L., Ostrovskiy, I., Overman, C. T., Ortega, G. S., Parent, S., Piepke, A., Pratte, J. -F., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retiere, F., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Sinclair, D., Skarpaas, K., Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X. L., Tarka, M., Todd, J., Tolba, T., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Visser, G., Vuilleumier, J. -L., Wagenpfeil, M., Weber, M., Wei, W., Wichoski, U., Wrede, G., Wu, S. X., Wu, W. H., Yang, L., Yen, Y. -R., Zeldovich, O., Zhang, X., Zhao, J., Zhou, Y., and Ziegler, T. Characterization of an Ionization Readout Tile for nEXO. United States: N. p., 2018. Web. doi:10.1088/1748-0221/13/01/P01006.
Jewell, M., Schubert, A., Cen, W. R., Dalmasson, J., DeVoe, R., Fabris, L., Gratta, G., Jamil, A., Li, G., Odian, A., Patel, M., Pocar, A., Qiu, D., Wang, Q., Wen, L. J., Albert, J. B., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P., Beck, D., Belov, V., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, G. F., Cao, L., Chambers, C., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Cree, W., Côté, M., Daniels, T., Daugherty, S. J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. Der, Didberidze, T., Dilling, J., Ding, Y. Y., Dolinski, M. J., Dragone, A., Fairbank, W., Farine, J., Feyzbakhsh, S., Fontaine, R., Fudenberg, D., Giacomini, G., Gornea, R., Hansen, E. V., Harris, D., Hasan, M., Heffner, M., Hoppe, E. W., House, A., Hufschmidt, P., Hughes, M., Hößl, J., Ito, Y., Iverson, A., Jiang, X. S., Johnston, S., Karelin, A., Kaufman, L. J., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Leonard, D. S., Li, S., Li, Z., Licciardi, C., Lin, Y. H., MacLellan, R., Michel, T., Mong, B., Moore, D., Murray, K., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Odgers, K., Oriunno, M., Orrell, J. L., Ostrovskiy, I., Overman, C. T., Ortega, G. S., Parent, S., Piepke, A., Pratte, J. -F., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retiere, F., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Sinclair, D., Skarpaas, K., Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X. L., Tarka, M., Todd, J., Tolba, T., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Visser, G., Vuilleumier, J. -L., Wagenpfeil, M., Weber, M., Wei, W., Wichoski, U., Wrede, G., Wu, S. X., Wu, W. H., Yang, L., Yen, Y. -R., Zeldovich, O., Zhang, X., Zhao, J., Zhou, Y., & Ziegler, T. Characterization of an Ionization Readout Tile for nEXO. United States. doi:10.1088/1748-0221/13/01/P01006.
Jewell, M., Schubert, A., Cen, W. R., Dalmasson, J., DeVoe, R., Fabris, L., Gratta, G., Jamil, A., Li, G., Odian, A., Patel, M., Pocar, A., Qiu, D., Wang, Q., Wen, L. J., Albert, J. B., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P., Beck, D., Belov, V., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, G. F., Cao, L., Chambers, C., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Cree, W., Côté, M., Daniels, T., Daugherty, S. J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. Der, Didberidze, T., Dilling, J., Ding, Y. Y., Dolinski, M. J., Dragone, A., Fairbank, W., Farine, J., Feyzbakhsh, S., Fontaine, R., Fudenberg, D., Giacomini, G., Gornea, R., Hansen, E. V., Harris, D., Hasan, M., Heffner, M., Hoppe, E. W., House, A., Hufschmidt, P., Hughes, M., Hößl, J., Ito, Y., Iverson, A., Jiang, X. S., Johnston, S., Karelin, A., Kaufman, L. J., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Leonard, D. S., Li, S., Li, Z., Licciardi, C., Lin, Y. H., MacLellan, R., Michel, T., Mong, B., Moore, D., Murray, K., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Odgers, K., Oriunno, M., Orrell, J. L., Ostrovskiy, I., Overman, C. T., Ortega, G. S., Parent, S., Piepke, A., Pratte, J. -F., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retiere, F., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Sinclair, D., Skarpaas, K., Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X. L., Tarka, M., Todd, J., Tolba, T., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Visser, G., Vuilleumier, J. -L., Wagenpfeil, M., Weber, M., Wei, W., Wichoski, U., Wrede, G., Wu, S. X., Wu, W. H., Yang, L., Yen, Y. -R., Zeldovich, O., Zhang, X., Zhao, J., Zhou, Y., and Ziegler, T. Wed . "Characterization of an Ionization Readout Tile for nEXO". United States. doi:10.1088/1748-0221/13/01/P01006.
@article{osti_1419988,
title = {Characterization of an Ionization Readout Tile for nEXO},
author = {Jewell, M. and Schubert, A. and Cen, W. R. and Dalmasson, J. and DeVoe, R. and Fabris, L. and Gratta, G. and Jamil, A. and Li, G. and Odian, A. and Patel, M. and Pocar, A. and Qiu, D. and Wang, Q. and Wen, L. J. and Albert, J. B. and Anton, G. and Arnquist, I. J. and Badhrees, I. and Barbeau, P. and Beck, D. and Belov, V. and Bourque, F. and Brodsky, J. P. and Brown, E. and Brunner, T. and Burenkov, A. and Cao, G. F. and Cao, L. and Chambers, C. and Charlebois, S. A. and Chiu, M. and Cleveland, B. and Coon, M. and Craycraft, A. and Cree, W. and Côté, M. and Daniels, T. and Daugherty, S. J. and Daughhetee, J. and Delaquis, S. and Mesrobian-Kabakian, A. Der and Didberidze, T. and Dilling, J. and Ding, Y. Y. and Dolinski, M. J. and Dragone, A. and Fairbank, W. and Farine, J. and Feyzbakhsh, S. and Fontaine, R. and Fudenberg, D. and Giacomini, G. and Gornea, R. and Hansen, E. V. and Harris, D. and Hasan, M. and Heffner, M. and Hoppe, E. W. and House, A. and Hufschmidt, P. and Hughes, M. and Hößl, J. and Ito, Y. and Iverson, A. and Jiang, X. S. and Johnston, S. and Karelin, A. and Kaufman, L. J. and Koffas, T. and Kravitz, S. and Krücken, R. and Kuchenkov, A. and Kumar, K. S. and Lan, Y. and Leonard, D. S. and Li, S. and Li, Z. and Licciardi, C. and Lin, Y. H. and MacLellan, R. and Michel, T. and Mong, B. and Moore, D. and Murray, K. and Newby, R. J. and Ning, Z. and Njoya, O. and Nolet, F. and Odgers, K. and Oriunno, M. and Orrell, J. L. and Ostrovskiy, I. and Overman, C. T. and Ortega, G. S. and Parent, S. and Piepke, A. and Pratte, J. -F. and Radeka, V. and Raguzin, E. and Rao, T. and Rescia, S. and Retiere, F. and Robinson, A. and Rossignol, T. and Rowson, P. C. and Roy, N. and Saldanha, R. and Sangiorgio, S. and Schmidt, S. and Schneider, J. and Sinclair, D. and Skarpaas, K. and Soma, A. K. and St-Hilaire, G. and Stekhanov, V. and Stiegler, T. and Sun, X. L. and Tarka, M. and Todd, J. and Tolba, T. and Tsang, R. and Tsang, T. and Vachon, F. and Veeraraghavan, V. and Visser, G. and Vuilleumier, J. -L. and Wagenpfeil, M. and Weber, M. and Wei, W. and Wichoski, U. and Wrede, G. and Wu, S. X. and Wu, W. H. and Yang, L. and Yen, Y. -R. and Zeldovich, O. and Zhang, X. and Zhao, J. and Zhou, Y. and Ziegler, T.},
abstractNote = {Here, a new design for the anode of a time projection chamber, consisting of a charge-detecting "tile", is investigated for use in large scale liquid xenon detectors. The tile is produced by depositing 60 orthogonal metal charge-collecting strips, 3 mm wide, on a 10 cm × 10 cm fused-silica wafer. These charge tiles may be employed by large detectors, such as the proposed tonne-scale nEXO experiment to search for neutrinoless double-beta decay. Modular by design, an array of tiles can cover a sizable area. The width of each strip is small compared to the size of the tile, so a Frisch grid is not required. A grid-less, tiled anode design is beneficial for an experiment such as nEXO, where a wire tensioning support structure and Frisch grid might contribute radioactive backgrounds and would have to be designed to accommodate cycling to cryogenic temperatures. The segmented anode also reduces some degeneracies in signal reconstruction that arise in large-area crossed-wire time projection chambers. A prototype tile was tested in a cell containing liquid xenon. Very good agreement is achieved between the measured ionization spectrum of a 207Bi source and simulations that include the microphysics of recombination in xenon and a detailed modeling of the electrostatic field of the detector. An energy resolution σ/E=5.5% is observed at 570 keV, comparable to the best intrinsic ionization-only resolution reported in literature for liquid xenon at 936 V/cm.},
doi = {10.1088/1748-0221/13/01/P01006},
journal = {Journal of Instrumentation},
number = 01,
volume = 13,
place = {United States},
year = {Wed Jan 10 00:00:00 EST 2018},
month = {Wed Jan 10 00:00:00 EST 2018}
}

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