Charge gradient microscopy

Roelofs, Andreas; Hong, Seungbum

Title: Charge gradient microscopy

Patent · Tue Feb 06 00:00:00 EST 2018

OSTI ID:1419770

Roelofs, Andreas; Hong, Seungbum

A method for rapid imaging of a material specimen includes positioning a tip to contact the material specimen, and applying a force to a surface of the material specimen via the tip. In addition, the method includes moving the tip across the surface of the material specimen while removing electrical charge therefrom, generating a signal produced by contact between the tip and the surface, and detecting, based on the data, the removed electrical charge induced through the tip during movement of the tip across the surface. The method further includes measuring the detected electrical charge.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

DOE Contract Number:: AC02-06CH11357

Assignee:: UCHICAGO ARGONNE, LLC (Chicago, IL)

Patent Number(s):: 9,885,861

Application Number:: 14/258,965

OSTI ID:: 1419770

Resource Relation:: Patent File Date: 2014 Apr 22

Country of Publication:: United States

Language:: English

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