Soft X-Ray Second Harmonic Generation as an Interfacial Probe

Lam, R. K.; Raj, S. L.; Pascal, T. A.; Pemmaraju, C. D.; Foglia, L.; Simoncig, A.; Fabris, N.; Miotti, P.; Hull, C. J.; Rizzuto, A. M.; Smith, J. W.; Mincigrucci, R.; Masciovecchio, C.; Gessini, A.; Allaria, E.; De Ninno, G.; Diviacco, B.; Roussel, E.; Spampinati, S.; Penco, G.; Di Mitri, S.; Trovò, M.; Danailov, M.; Christensen, S. T.; Sokaras, D.; Weng, T. -C.; Coreno, M.; Poletto, L.; Drisdell, W. S.; Prendergast, D.; Giannessi, L.; Principi, E.; Nordlund, D.; Saykally, R. J.; Schwartz, C. P.

doi:10.1103/PhysRevLett.120.023901

Title: Soft X-Ray Second Harmonic Generation as an Interfacial Probe

Journal Article · Mon Jan 08 00:00:00 EST 2018 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.120.023901· OSTI ID:1418311

Lam, R. K. ^[1]; Raj, S. L. ^[1]; Pascal, T. A. ^[2]; Pemmaraju, C. D. ^[3]; Foglia, L. ^[4]; Simoncig, A. ^[4]; Fabris, N. ^[5]; Miotti, P. ^[5]; Hull, C. J. ^[1]; Rizzuto, A. M. ^[1]; Smith, J. W. ^[1]; Mincigrucci, R. ^[4]; Masciovecchio, C. ^[4]; Gessini, A. ^[4]; Allaria, E. ^[4]; De Ninno, G. ^[6]; Diviacco, B. ^[4]; Roussel, E. ^[4]; Spampinati, S. ^[4]; Penco, G. ^[4] more »

Univ. of California, Berkeley, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Elettra-Sincrotrone Trieste S.C.p.A., Trieste (Italy)
National Research Council of Italy, Padova (Italy); Univ. of Padova, Padova (Italy)
Elettra-Sincrotrone Trieste S.C.p.A., Trieste (Italy); Univ. of Nova Gorica, Nova Gorica (Slovenia)
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Center for High Pressure Science & Technology Advanced Research, Shanghai (China)
Elettra-Sincrotrone Trieste S.C.p.A., Trieste (Italy); Elettra Lab., Trieste (Italy)
National Research Council of Italy, Padova (Italy)
Elettra-Sincrotrone Trieste S.C.p.A., Trieste (Italy); C.R. Frascati, Frascati (Rome) (Italy)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)

Nonlinear optical processes at soft x-ray wavelengths have remained largely unexplored due to the lack of available light sources with the requisite intensity and coherence. Here we report the observation of soft x-ray second harmonic generation near the carbon K edge (~284 eV) in graphite thin films generated by high intensity, coherent soft x-ray pulses at the FERMI free electron laser. Our experimental results and accompanying first-principles theoretical analysis highlight the effect of resonant enhancement above the carbon K edge and show the technique to be interfacially sensitive in a centrosymmetric sample with second harmonic intensity arising primarily from the first atomic layer at the open surface. Here, this technique and the associated theoretical framework demonstrate the ability to selectively probe interfaces, including those that are buried, with elemental specificity, providing a new tool for a range of scientific problems.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States); SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-05CH11231; AC02-76SF00515; AC36-08GO28308; SC0004993; W911NF-13-1-0483; W911NF-17-1-0163; DGE 1106400

OSTI ID:: 1418311

Alternate ID(s):: OSTI ID: 1416070; OSTI ID: 1417659

Journal Information:: Physical Review Letters, Vol. 120, Issue 2; ISSN 0031-9007

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 54 works

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