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Title: Light-emitting device test systems

Abstract

Light-emitting devices, such as LEDs, are tested using a photometric unit. The photometric unit, which may be an integrating sphere, can measure flux, color, or other properties of the devices. The photometric unit may have a single port or both an inlet and outlet. Light loss through the port, inlet, or outlet can be reduced or calibrated for. These testing systems can provide increased reliability, improved throughput, and/or improved measurement accuracy.

Inventors:
; ; ; ;
Publication Date:
Research Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EE) (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1417881
Patent Number(s):
9,874,597
Application Number:
14/696,891
Assignee:
KLA-Tenor Corporation (Milpitas, CA) DOEEE
DOE Contract Number:
EE0005877
Resource Type:
Patent
Resource Relation:
Patent File Date: 2015 Apr 27
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

McCord, Mark, Brodie, Alan, George, James, Guan, Yu, and Nyffenegger, Ralph. Light-emitting device test systems. United States: N. p., 2018. Web.
McCord, Mark, Brodie, Alan, George, James, Guan, Yu, & Nyffenegger, Ralph. Light-emitting device test systems. United States.
McCord, Mark, Brodie, Alan, George, James, Guan, Yu, and Nyffenegger, Ralph. Tue . "Light-emitting device test systems". United States. doi:. https://www.osti.gov/servlets/purl/1417881.
@article{osti_1417881,
title = {Light-emitting device test systems},
author = {McCord, Mark and Brodie, Alan and George, James and Guan, Yu and Nyffenegger, Ralph},
abstractNote = {Light-emitting devices, such as LEDs, are tested using a photometric unit. The photometric unit, which may be an integrating sphere, can measure flux, color, or other properties of the devices. The photometric unit may have a single port or both an inlet and outlet. Light loss through the port, inlet, or outlet can be reduced or calibrated for. These testing systems can provide increased reliability, improved throughput, and/or improved measurement accuracy.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 23 00:00:00 EST 2018},
month = {Tue Jan 23 00:00:00 EST 2018}
}

Patent:

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