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Title: Depth distribution of secondary phases in kesterite Cu 2ZnSnS 4 by angle-resolved X-ray absorption spectroscopy

Abstract

The depth distribution of secondary phases in the solar cell absorber material Cu 2ZnSnS 4 (CZTS) is quantitatively investigated using X-ray Absorption Near Edge Structure (XANES) analysis at the K-edge of sulfur at varying incidence angles. Varying information depths from several nanometers up to the full thickness is achieved. A quantitative profile of the phase distribution is obtained by a self-consistent fit of a multilayer model to the XANES spectra for different angles. Single step co-evaporated CZTS thin-films are found to exhibit zinc and copper sulfide secondary phases preferentially at the front or back interfaces of the film.

Authors:
ORCiD logo [1]; ORCiD logo [2];  [3]; ORCiD logo [2];  [4]
  1. Helmholtz-Zentrum Berlin fur Materialien und Energie GmbH, Berlin (Germany). Department Structure and Dynamics of Energy Materials; Fakultat 4-Physik, Bergische Universitat Wuppertal (Germany)
  2. Fakultat 4-Physik, Bergische Universitat Wuppertal (Germany)
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource (SSRL)
  4. Helmholtz-Zentrum Berlin fur Materialien und Energie GmbH, Berlin (Germany)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1417336
Grant/Contract Number:  
AC02-76SF00515
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
APL Materials
Additional Journal Information:
Journal Volume: 5; Journal Issue: 12; Journal ID: ISSN 2166-532X
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Just, J., Lützenkirchen-Hecht, D., Müller, O., Frahm, R., and Unold, T.. Depth distribution of secondary phases in kesterite Cu2ZnSnS4 by angle-resolved X-ray absorption spectroscopy. United States: N. p., 2017. Web. doi:10.1063/1.5000306.
Just, J., Lützenkirchen-Hecht, D., Müller, O., Frahm, R., & Unold, T.. Depth distribution of secondary phases in kesterite Cu2ZnSnS4 by angle-resolved X-ray absorption spectroscopy. United States. doi:10.1063/1.5000306.
Just, J., Lützenkirchen-Hecht, D., Müller, O., Frahm, R., and Unold, T.. Tue . "Depth distribution of secondary phases in kesterite Cu2ZnSnS4 by angle-resolved X-ray absorption spectroscopy". United States. doi:10.1063/1.5000306. https://www.osti.gov/servlets/purl/1417336.
@article{osti_1417336,
title = {Depth distribution of secondary phases in kesterite Cu2ZnSnS4 by angle-resolved X-ray absorption spectroscopy},
author = {Just, J. and Lützenkirchen-Hecht, D. and Müller, O. and Frahm, R. and Unold, T.},
abstractNote = {The depth distribution of secondary phases in the solar cell absorber material Cu2ZnSnS4 (CZTS) is quantitatively investigated using X-ray Absorption Near Edge Structure (XANES) analysis at the K-edge of sulfur at varying incidence angles. Varying information depths from several nanometers up to the full thickness is achieved. A quantitative profile of the phase distribution is obtained by a self-consistent fit of a multilayer model to the XANES spectra for different angles. Single step co-evaporated CZTS thin-films are found to exhibit zinc and copper sulfide secondary phases preferentially at the front or back interfaces of the film.},
doi = {10.1063/1.5000306},
journal = {APL Materials},
number = 12,
volume = 5,
place = {United States},
year = {Tue Dec 12 00:00:00 EST 2017},
month = {Tue Dec 12 00:00:00 EST 2017}
}

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Works referenced in this record:

X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92
journal, July 1993

  • Henke, B. L.; Gullikson, E. M.; Davis, J. C.
  • Atomic Data and Nuclear Data Tables, Vol. 54, Issue 2, p. 181-342
  • DOI: 10.1006/adnd.1993.1013