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Title: Reduced electron exposure for energy-dispersive spectroscopy using dynamic sampling

Journal Article · · Ultramicroscopy
 [1];  [2];  [3];  [4];  [5];  [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division
  2. Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division ; Purdue Univ., West Lafayette, IN (United States). ECE Department
  3. Argonne National Lab. (ANL), Argonne, IL (United States). Mathematics and Computer Science Division
  4. Northwestern Univ., Evanston, IL (United States). Department of Materials Science and Engineering
  5. Purdue Univ., West Lafayette, IN (United States). ECE Department

Analytical electron microscopy and spectroscopy of biological specimens, polymers, and other beam sensitive materials has been a challenging area due to irradiation damage. There is a pressing need to develop novel imaging and spectroscopic imaging methods that will minimize such sample damage as well as reduce the data acquisition time. The latter is useful for high-throughput analysis of materials structure and chemistry. Here, in this work, we present a novel machine learning based method for dynamic sparse sampling of EDS data using a scanning electron microscope. Our method, based on the supervised learning approach for dynamic sampling algorithm and neural networks based classification of EDS data, allows a dramatic reduction in the total sampling of up to 90%, while maintaining the fidelity of the reconstructed elemental maps and spectroscopic data. In conclusion, we believe this approach will enable imaging and elemental mapping of materials that would otherwise be inaccessible to these analysis techniques.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); Argonne National Laboratory - Laboratory Directed Research and Development (LDRD)
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1416973
Alternate ID(s):
OSTI ID: 1549382
Journal Information:
Ultramicroscopy, Vol. 184, Issue PB; ISSN 0304-3991
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 8 works
Citation information provided by
Web of Science

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Cited By (1)

Progress toward autonomous experimental systems for alloy development journal April 2019