Femtosecond mega-electron-volt electron microdiffraction

Shen, X.; Li, R. K.; Lundstrom, U.; Lane, T. J.; Reid, A. H.; Weathersby, S. P.; Wang, X. J.

doi:10.1016/j.ultramic.2017.08.019

Title: Femtosecond mega-electron-volt electron microdiffraction

Journal Article · Fri Sep 01 00:00:00 EDT 2017 · Ultramicroscopy

DOI:https://doi.org/10.1016/j.ultramic.2017.08.019· OSTI ID:1416370

Shen, X. ^[1]; Li, R. K. ^[1]; Lundstrom, U. ^[1]; Lane, T. J. ^[1]; Reid, A. H. ^[1]; Weathersby, S. P. ^[1]; Wang, X. J. ^[1]

SLAC National Accelerator Lab., Menlo Park, CA (United States)

To understand and control the basic functions of physical, chemical and biological processes from micron to nano-meter scale, an instrument capable of visualizing transient structural changes of inhomogeneous materials with atomic spatial and temporal resolutions, is required. One such technique is femtosecond electron microdiffraction, in which a short electron pulse with femtosecond-scale duration is focused into a micron-scale spot and used to obtain diffraction images to resolve ultrafast structural dynamics over a localized crystalline domain. In this letter, we report the experimental demonstration of time-resolved mega-electron-volt electron microdiffraction which achieves a 5 μm root-mean-square (rms) beam size on the sample and a 110 fs rms temporal resolution. Using pulses of 10k electrons at 4.2 MeV energy with a normalized emittance 3 nm-rad, we obtained high quality diffraction from a single 10 μm paraffin (C₄₄H₉₀) crystal. The phonon softening mode in optical-pumped polycrystalline Bi was also time-resolved, demonstrating the temporal resolution limits of the instrument. In conclusion, this new characterization capability will open many research opportunities in material and biological sciences.

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Research Organization:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-76SF00515

OSTI ID:: 1416370

Alternate ID(s):: OSTI ID: 1549779

Journal Information:: Ultramicroscopy, Vol. 184, Issue PA; ISSN 0304-3991

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 33 works

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Relativistic Ultrafast Electron Microscopy: Single-Shot Diffraction Imaging with Femtosecond Electron Pulses Yang, Jinfeng; Yoshida, Yoichi Advances in Condensed Matter Physics, Vol. 2019 https://doi.org/10.1155/2019/9739241	journal	May 2019
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Determination of the electron-lattice coupling strength of copper with ultrafast MeV electron diffraction Mo, M. Z.; Becker, V.; Ofori-Okai, B. K. Review of Scientific Instruments, Vol. 89, Issue 10 https://doi.org/10.1063/1.5035368	journal	October 2018
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