Determining the Cause of An Interfacial Adhesive Failure Using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS).
Conference
·
OSTI ID:1415724
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1415724
- Report Number(s):
- SAND2016-11556C; 649154
- Resource Relation:
- Conference: Proposed for presentation at the AVS 63rd International Symposium and Exhibition held November 7-11, 2016 in Nashville, TN.
- Country of Publication:
- United States
- Language:
- English
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OSTI ID:1415724