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Title: Talbot–Lau x-ray deflectometry phase-retrieval methods for electron density diagnostics in high-energy density experiments

Authors:
 [1];  [1];  [2];  [2];  [2];  [2];  [2]
  1. Johns Hopkins Univ., Baltimore, MD (United States). Dept. of Physics and Astronomy
  2. Univ. of Rochester, NY (United States). Lab. for Laser Energetics
Publication Date:
Research Org.:
Johns Hopkins Univ., Baltimore, MD (United States); Univ. of Rochester, NY (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1415326
Grant/Contract Number:  
NA0002955
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Applied Optics
Additional Journal Information:
Journal Name: Applied Optics Journal Volume: 57 Journal Issue: 2; Journal ID: ISSN 1559-128X
Publisher:
Optical Society of America
Country of Publication:
United States
Language:
English

Citation Formats

Valdivia, Maria Pia, Stutman, Dan, Stoeckl, Christian, Mileham, Chad, Begishev, Ildar A., Bromage, Jake, and Regan, Sean P.. Talbot–Lau x-ray deflectometry phase-retrieval methods for electron density diagnostics in high-energy density experiments. United States: N. p., 2018. Web. doi:10.1364/AO.57.000138.
Valdivia, Maria Pia, Stutman, Dan, Stoeckl, Christian, Mileham, Chad, Begishev, Ildar A., Bromage, Jake, & Regan, Sean P.. Talbot–Lau x-ray deflectometry phase-retrieval methods for electron density diagnostics in high-energy density experiments. United States. doi:10.1364/AO.57.000138.
Valdivia, Maria Pia, Stutman, Dan, Stoeckl, Christian, Mileham, Chad, Begishev, Ildar A., Bromage, Jake, and Regan, Sean P.. Wed . "Talbot–Lau x-ray deflectometry phase-retrieval methods for electron density diagnostics in high-energy density experiments". United States. doi:10.1364/AO.57.000138.
@article{osti_1415326,
title = {Talbot–Lau x-ray deflectometry phase-retrieval methods for electron density diagnostics in high-energy density experiments},
author = {Valdivia, Maria Pia and Stutman, Dan and Stoeckl, Christian and Mileham, Chad and Begishev, Ildar A. and Bromage, Jake and Regan, Sean P.},
abstractNote = {},
doi = {10.1364/AO.57.000138},
journal = {Applied Optics},
number = 2,
volume = 57,
place = {United States},
year = {Wed Jan 03 00:00:00 EST 2018},
month = {Wed Jan 03 00:00:00 EST 2018}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on January 3, 2019
Publisher's Accepted Manuscript

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