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Title: Characterization of Molten CZT Using Thermal Conductivity and Heat Capacity

Abstract

To compare thermal conductivity of a polycrystalline semiconductor to the single crystal semiconductor using thermo-physical data acquired from Simultaneous Thermal Analysis and Transient Plane Source heating.

Authors:
 [1];  [1];  [1]
  1. Y-12 National Security Complex, Oak Ridge, TN (United States)
Publication Date:
Research Org.:
Oak Ridge Y-12 Plant (Y-12), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1411165
Report Number(s):
IROS362
DOE Contract Number:
DE-NA0001942
Resource Type:
Conference
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; polycrystalline, crystals, thermal conductivity, energy dispersive spectroscopy

Citation Formats

Nero, Franco, Jackson, Maxx, and Stowe, Ashley. Characterization of Molten CZT Using Thermal Conductivity and Heat Capacity. United States: N. p., 2017. Web.
Nero, Franco, Jackson, Maxx, & Stowe, Ashley. Characterization of Molten CZT Using Thermal Conductivity and Heat Capacity. United States.
Nero, Franco, Jackson, Maxx, and Stowe, Ashley. 2017. "Characterization of Molten CZT Using Thermal Conductivity and Heat Capacity". United States. doi:. https://www.osti.gov/servlets/purl/1411165.
@article{osti_1411165,
title = {Characterization of Molten CZT Using Thermal Conductivity and Heat Capacity},
author = {Nero, Franco and Jackson, Maxx and Stowe, Ashley},
abstractNote = {To compare thermal conductivity of a polycrystalline semiconductor to the single crystal semiconductor using thermo-physical data acquired from Simultaneous Thermal Analysis and Transient Plane Source heating.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = 2017,
month =
}

Conference:
Other availability
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