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Title: Extended Pulse-Powered Humidity-Freeze Cycling for Testing Module-Level Power Electronics

Abstract

An EMI suppression capacitor (polypropylene film type) failed by 'popcorning' due to vapor outgassing in pulse powered humidity-freeze cycles. No shorts or shunts could be detected despite mildly corroded metallization visible in the failed capacitor. Humidity-freeze cycling is optimized to break into moisture barriers. However, further studies will be required on additional module level power electronic (MLPE) devices to optimize the stress testing for condensation to precipitate any weakness to short circuiting and other humidity/bias failure modes.

Authors:
 [1];  [1];  [1];  [1]
  1. National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
OSTI Identifier:
1411134
Report Number(s):
NREL/PR-5J00-68261
DOE Contract Number:
AC36-08GO28308
Resource Type:
Conference
Resource Relation:
Conference: Presented at the NREL/SNL/BNL PV Reliability Workshops, 28 February - 2 March 2017, Lakewood, Colorado
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; module level power electronics; reliability; durability; accelerated stress testing

Citation Formats

Hacke, Peter L, Rodriguez, Miguel, Kempe, Michael D, and Repins, Ingrid L. Extended Pulse-Powered Humidity-Freeze Cycling for Testing Module-Level Power Electronics. United States: N. p., 2017. Web.
Hacke, Peter L, Rodriguez, Miguel, Kempe, Michael D, & Repins, Ingrid L. Extended Pulse-Powered Humidity-Freeze Cycling for Testing Module-Level Power Electronics. United States.
Hacke, Peter L, Rodriguez, Miguel, Kempe, Michael D, and Repins, Ingrid L. Tue . "Extended Pulse-Powered Humidity-Freeze Cycling for Testing Module-Level Power Electronics". United States. doi:. https://www.osti.gov/servlets/purl/1411134.
@article{osti_1411134,
title = {Extended Pulse-Powered Humidity-Freeze Cycling for Testing Module-Level Power Electronics},
author = {Hacke, Peter L and Rodriguez, Miguel and Kempe, Michael D and Repins, Ingrid L},
abstractNote = {An EMI suppression capacitor (polypropylene film type) failed by 'popcorning' due to vapor outgassing in pulse powered humidity-freeze cycles. No shorts or shunts could be detected despite mildly corroded metallization visible in the failed capacitor. Humidity-freeze cycling is optimized to break into moisture barriers. However, further studies will be required on additional module level power electronic (MLPE) devices to optimize the stress testing for condensation to precipitate any weakness to short circuiting and other humidity/bias failure modes.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Nov 28 00:00:00 EST 2017},
month = {Tue Nov 28 00:00:00 EST 2017}
}

Conference:
Other availability
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