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Method of making thermally-isolated silicon-based integrated circuits

Patent ·
OSTI ID:1409829
Thermally isolated devices may be formed by performing a series of etches on a silicon-based substrate. As a result of the series of etches, silicon material may be removed from underneath a region of an integrated circuit (IC). The removal of the silicon material from underneath the IC forms a gap between remaining substrate and the integrated circuit, though the integrated circuit remains connected to the substrate via a support bar arrangement that suspends the integrated circuit over the substrate. The creation of this gap functions to release the device from the substrate and create a thermally-isolated integrated circuit.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000;
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
Patent Number(s):
9,824,932
Application Number:
15/234,932
OSTI ID:
1409829
Country of Publication:
United States
Language:
English

References (2)

Single-chip precision oscillators based on multi-frequency, high-Q aluminum nitride MEMS resonators conference June 2009
CMOS-SOI-MEMS Transistor for Uncooled IR Imaging journal September 2009

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