Experimental metrology to obtain thermal phonon transmission coefficients at solid interfaces

Hua, Chengyun; Chen, Xiangwen; Ravichandran, Navaneetha K.; Minnich, Austin J.

doi:10.1103/PhysRevB.95.205423

Title: Experimental metrology to obtain thermal phonon transmission coefficients at solid interfaces

Journal Article · Wed May 17 00:00:00 EDT 2017 · Physical Review B

DOI:https://doi.org/10.1103/PhysRevB.95.205423· OSTI ID:1407989

^[1]; Chen, Xiangwen ^[2]; Ravichandran, Navaneetha K. ^[3]; Minnich, Austin J. ^[2]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). BioEnergy Science Center (BESC)
California Inst. of Technology (CalTech), Pasadena, CA (United States)
Boston College, Chestnut Hill, MA (United States)

Interfaces play an essential role in phonon-mediated heat conduction in solids, impacting applications ranging from thermoelectric waste heat recovery to heat dissipation in electronics. From the microscopic perspective, interfacial phonon transport is described by transmission coefficients that link vibrational modes in the materials composing the interface. But, direct experimental determination of these coefficients is challenging because most experiments provide a mode-averaged interface conductance that obscures the microscopic detail. Here, we report a metrology to extract thermal phonon transmission coefficients at solid interfaces using ab initio phonon transport modeling and a thermal characterization technique, time-domain thermoreflectance. In combination with transmission electron microscopy characterization of the interface, our approach allows us to link the atomic structure of an interface to the spectral content of the heat crossing it. This work provides a useful perspective on the microscopic processes governing interfacial heat conduction.

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Research Organization:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE; National Science Foundation (NSF)

Grant/Contract Number:: AC05-00OR22725; CBET 1254213

OSTI ID:: 1407989

Journal Information:: Physical Review B, Vol. 95, Issue 20; ISSN 2469-9950

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 59 works

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