Placing single atoms in graphene with a scanning transmission electron microscope

Dyck, Ondrej E.; Kim, Songkil; Kalinin, Sergei V.; Jesse, Stephen

doi:10.1063/1.4998599

Title: Placing single atoms in graphene with a scanning transmission electron microscope

Journal Article · Thu Sep 14 00:00:00 EDT 2017 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4998599· OSTI ID:1407772

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Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

We demonstrate that the sub-atomically focused beam of a scanning transmission electron microscope (STEM) can be used to controllably manipulate individual dopant atoms in a 2D graphene lattice. We demonstrate the manipulation of adsorbed source materials and the graphene lattice with the electron beam such that individual vacancy defects can be controllably passivated by Si substitutional atoms. We further demonstrate that these Si defects may be directed through the lattice via e-beam control or modified (as yet, uncontrollably) to form new defects which can incorporate new atoms into the graphene lattice. Furthermore, these studies demonstrate the potential of STEM for atom-by-atom nanofabrication and fundamental studies of chemical reactions in 2D materials on the atomic level.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC05-00OR22725; NA

OSTI ID:: 1407772

Alternate ID(s):: OSTI ID: 1390370

Journal Information:: Applied Physics Letters, Vol. 111, Issue 11; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 92 works

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