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Title: Characterization of Two-Qubit Quantum Gates in a Scalable Surface Ion Trap.

Abstract

Abstract not provided.

Authors:
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
IARPA
OSTI Identifier:
1406965
Report Number(s):
SAND2016-10961PE
648730
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Invited seminar talk at NIST Boulder held October 27, 2016 in Boulder, CO.
Country of Publication:
United States
Language:
English

Citation Formats

Maunz, Peter Lukas Wilhelm. Characterization of Two-Qubit Quantum Gates in a Scalable Surface Ion Trap.. United States: N. p., 2016. Web.
Maunz, Peter Lukas Wilhelm. Characterization of Two-Qubit Quantum Gates in a Scalable Surface Ion Trap.. United States.
Maunz, Peter Lukas Wilhelm. Sat . "Characterization of Two-Qubit Quantum Gates in a Scalable Surface Ion Trap.". United States. doi:. https://www.osti.gov/servlets/purl/1406965.
@article{osti_1406965,
title = {Characterization of Two-Qubit Quantum Gates in a Scalable Surface Ion Trap.},
author = {Maunz, Peter Lukas Wilhelm},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sat Oct 01 00:00:00 EDT 2016},
month = {Sat Oct 01 00:00:00 EDT 2016}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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