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Title: Single-shot optical recorder with sub-picosecond resolution and scalable record length on a semiconductor wafer

Abstract

In this study, we demonstrate a novel, single-shot recording technology for transient optical signals. A resolution of 0.4 ps over a record length of 54 ps was demonstrated. Here, a pump pulse crossing through a signal samples a diagonal “slice” of space–time, enabling a camera to record spatially the time content of the signal. Unlike related X (2)-based cross-correlation techniques, here the signal is sampled through optically pumped carriers that modify the refractive index of a silicon wafer. Surrounding the wafer with birefringent retarders enables two time-staggered, orthogonally polarized signal copies to probe the wafer. Recombining the copies at a final crossed polarizer destructively interferes with them, except during the brief stagger window, where a differential phase shift is incurred. This enables the integrating response of the rapidly excited but persistent carriers to be optically differentiated. Lastly, this sampling mechanism has several advantages that enable scaling to long record lengths, including making use of large, inexpensive semiconductor wafers, eliminating the need for phase matching, broad insensitivity to the spectral and angular properties of the pump, and overall hardware simplicity.

Authors:
 [1];  [1]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1406431
Alternate Identifier(s):
OSTI ID: 1402535
Report Number(s):
LLNL-JRNL-729266
Journal ID: ISSN 0146-9592; OPLEDP
Grant/Contract Number:
AC52-07NA27344
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Optics Letters
Additional Journal Information:
Journal Volume: 42; Journal Issue: 21; Journal ID: ISSN 0146-9592
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 47 OTHER INSTRUMENTATION; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; Switching; Ultrafast measurements; Ultrafast nonlinear optics

Citation Formats

Muir, R., and Heebner, J.. Single-shot optical recorder with sub-picosecond resolution and scalable record length on a semiconductor wafer. United States: N. p., 2017. Web. doi:10.1364/OL.42.004414.
Muir, R., & Heebner, J.. Single-shot optical recorder with sub-picosecond resolution and scalable record length on a semiconductor wafer. United States. doi:10.1364/OL.42.004414.
Muir, R., and Heebner, J.. Tue . "Single-shot optical recorder with sub-picosecond resolution and scalable record length on a semiconductor wafer". United States. doi:10.1364/OL.42.004414.
@article{osti_1406431,
title = {Single-shot optical recorder with sub-picosecond resolution and scalable record length on a semiconductor wafer},
author = {Muir, R. and Heebner, J.},
abstractNote = {In this study, we demonstrate a novel, single-shot recording technology for transient optical signals. A resolution of 0.4 ps over a record length of 54 ps was demonstrated. Here, a pump pulse crossing through a signal samples a diagonal “slice” of space–time, enabling a camera to record spatially the time content of the signal. Unlike related X(2)-based cross-correlation techniques, here the signal is sampled through optically pumped carriers that modify the refractive index of a silicon wafer. Surrounding the wafer with birefringent retarders enables two time-staggered, orthogonally polarized signal copies to probe the wafer. Recombining the copies at a final crossed polarizer destructively interferes with them, except during the brief stagger window, where a differential phase shift is incurred. This enables the integrating response of the rapidly excited but persistent carriers to be optically differentiated. Lastly, this sampling mechanism has several advantages that enable scaling to long record lengths, including making use of large, inexpensive semiconductor wafers, eliminating the need for phase matching, broad insensitivity to the spectral and angular properties of the pump, and overall hardware simplicity.},
doi = {10.1364/OL.42.004414},
journal = {Optics Letters},
number = 21,
volume = 42,
place = {United States},
year = {Tue Oct 24 00:00:00 EDT 2017},
month = {Tue Oct 24 00:00:00 EDT 2017}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on October 24, 2018
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Cited by: 1 work
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