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Title: Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy

Abstract

A multistep, non-destructive grain morphology reconstruction methodology that is applicable to near-surface volumes is developed and tested on synthetic grain structures. This approach probes the subsurface crystal orientation using differential aperture x-ray microscopy on a sparse grid across the microstructure volume of interest. Resulting orientation data are clustered according to proximity in physical and orientation space and used as seed points for an initial Voronoi tessellation to (crudely) approximate the grain morphology. Curvature-driven grain boundary relaxation, simulated by means of the Voronoi implicit interface method, progressively improves the reconstruction accuracy. The similarity between bulk and readily accessible surface reconstruction error provides an objective termination criterion for boundary relaxation.

Authors:
ORCiD logo; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1406376
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
JOM. Journal of the Minerals, Metals & Materials Society
Additional Journal Information:
Journal Volume: 69; Journal Issue: 6; Journal ID: ISSN 1047-4838
Publisher:
Springer
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Eisenlohr, Philip, Shanthraj, Pratheek, Vande Kieft, Brendan R., Bieler, Thomas R., Liu, Wenjun, and Xu, Ruqing. Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy. United States: N. p., 2017. Web. doi:10.1007/s11837-017-2357-z.
Eisenlohr, Philip, Shanthraj, Pratheek, Vande Kieft, Brendan R., Bieler, Thomas R., Liu, Wenjun, & Xu, Ruqing. Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy. United States. doi:10.1007/s11837-017-2357-z.
Eisenlohr, Philip, Shanthraj, Pratheek, Vande Kieft, Brendan R., Bieler, Thomas R., Liu, Wenjun, and Xu, Ruqing. Thu . "Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy". United States. doi:10.1007/s11837-017-2357-z.
@article{osti_1406376,
title = {Subsurface Grain Morphology Reconstruction by Differential Aperture X-ray Microscopy},
author = {Eisenlohr, Philip and Shanthraj, Pratheek and Vande Kieft, Brendan R. and Bieler, Thomas R. and Liu, Wenjun and Xu, Ruqing},
abstractNote = {A multistep, non-destructive grain morphology reconstruction methodology that is applicable to near-surface volumes is developed and tested on synthetic grain structures. This approach probes the subsurface crystal orientation using differential aperture x-ray microscopy on a sparse grid across the microstructure volume of interest. Resulting orientation data are clustered according to proximity in physical and orientation space and used as seed points for an initial Voronoi tessellation to (crudely) approximate the grain morphology. Curvature-driven grain boundary relaxation, simulated by means of the Voronoi implicit interface method, progressively improves the reconstruction accuracy. The similarity between bulk and readily accessible surface reconstruction error provides an objective termination criterion for boundary relaxation.},
doi = {10.1007/s11837-017-2357-z},
journal = {JOM. Journal of the Minerals, Metals & Materials Society},
issn = {1047-4838},
number = 6,
volume = 69,
place = {United States},
year = {2017},
month = {4}
}

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