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Title: Chapter 14: Electron Microscopy on Thin Films for Solar Cells

Abstract

This chapter overviews the various techniques applied in scanning electron microscopy (SEM) and transmission electron microscopy (TEM), and highlights their possibilities and also limitations. It gives the various imaging and analysis techniques applied on a scanning electron microscope. The chapter shows that imaging is divided into that making use of secondary electrons (SEs) and of backscattered electrons (BSEs), resulting in different contrasts in the images and thus providing information on compositions, microstructures, and surface potentials. Whenever aiming for imaging and analyses at scales of down to the angstroms range, TEM and its related techniques are appropriate tools. In many cases, also SEM techniques provide the access to various material properties of the individual layers, not requiring specimen preparation as time consuming as TEM techniques. Finally, the chapter dedicates to cross-sectional specimen preparation for electron microscopy. The preparation decides indeed on the quality of imaging and analyses.

Authors:
 [1];  [2];  [2];  [2]
  1. National Renewable Energy Laboratory (NREL), Golden, CO (United States)
  2. Helmholtz-Zentrum Berlin fur Materialien und Energie GmbH (HZB)
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE)
OSTI Identifier:
1405275
Report Number(s):
NREL/CH-5200-70375
DOE Contract Number:
AC36-08GO28308
Resource Type:
Book
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 42 ENGINEERING; backscattered electrons; conventional transmission electron microscopy; cross-sectional specimen preparation; imaging techniques; scanning electron microscopy; scanning transmission electron microscopy; secondary electrons; thin-film solar cells

Citation Formats

Romero, Manuel, Abou-Ras, Daniel, Nichterwitz, Melanie, and Schmidt, Sebastian S. Chapter 14: Electron Microscopy on Thin Films for Solar Cells. United States: N. p., 2016. Web. doi:10.1002/9783527699025.ch14.
Romero, Manuel, Abou-Ras, Daniel, Nichterwitz, Melanie, & Schmidt, Sebastian S. Chapter 14: Electron Microscopy on Thin Films for Solar Cells. United States. doi:10.1002/9783527699025.ch14.
Romero, Manuel, Abou-Ras, Daniel, Nichterwitz, Melanie, and Schmidt, Sebastian S. Fri . "Chapter 14: Electron Microscopy on Thin Films for Solar Cells". United States. doi:10.1002/9783527699025.ch14.
@article{osti_1405275,
title = {Chapter 14: Electron Microscopy on Thin Films for Solar Cells},
author = {Romero, Manuel and Abou-Ras, Daniel and Nichterwitz, Melanie and Schmidt, Sebastian S.},
abstractNote = {This chapter overviews the various techniques applied in scanning electron microscopy (SEM) and transmission electron microscopy (TEM), and highlights their possibilities and also limitations. It gives the various imaging and analysis techniques applied on a scanning electron microscope. The chapter shows that imaging is divided into that making use of secondary electrons (SEs) and of backscattered electrons (BSEs), resulting in different contrasts in the images and thus providing information on compositions, microstructures, and surface potentials. Whenever aiming for imaging and analyses at scales of down to the angstroms range, TEM and its related techniques are appropriate tools. In many cases, also SEM techniques provide the access to various material properties of the individual layers, not requiring specimen preparation as time consuming as TEM techniques. Finally, the chapter dedicates to cross-sectional specimen preparation for electron microscopy. The preparation decides indeed on the quality of imaging and analyses.},
doi = {10.1002/9783527699025.ch14},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Jul 22 00:00:00 EDT 2016},
month = {Fri Jul 22 00:00:00 EDT 2016}
}

Book:
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