skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Effects of Process Variation on Radiation-Induced Edge Leakage Currents in n-Channel MOSFETs.

Abstract

Abstract not provided.

Authors:
; ; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1404769
Report Number(s):
SAND2016-10097C
648125
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the RADECS 2016 held September 19-23, 2016 in Bremen, Germany.
Country of Publication:
United States
Language:
English

Citation Formats

Hugh Barnaby, Garrett Schlenvogt, Kiraneswar Mathuseenu, and McLain, Michael Lee. Effects of Process Variation on Radiation-Induced Edge Leakage Currents in n-Channel MOSFETs.. United States: N. p., 2016. Web.
Hugh Barnaby, Garrett Schlenvogt, Kiraneswar Mathuseenu, & McLain, Michael Lee. Effects of Process Variation on Radiation-Induced Edge Leakage Currents in n-Channel MOSFETs.. United States.
Hugh Barnaby, Garrett Schlenvogt, Kiraneswar Mathuseenu, and McLain, Michael Lee. Sat . "Effects of Process Variation on Radiation-Induced Edge Leakage Currents in n-Channel MOSFETs.". United States. doi:. https://www.osti.gov/servlets/purl/1404769.
@article{osti_1404769,
title = {Effects of Process Variation on Radiation-Induced Edge Leakage Currents in n-Channel MOSFETs.},
author = {Hugh Barnaby and Garrett Schlenvogt and Kiraneswar Mathuseenu and McLain, Michael Lee},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sat Oct 01 00:00:00 EDT 2016},
month = {Sat Oct 01 00:00:00 EDT 2016}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

Save / Share: