Detecting element specific electrons from a single cobalt nanocluster with synchrotron x-ray scanning tunneling microscopy
Abstract
We use a nanofabricated scanning tunneling microscope tip as a detector to investigate local X-ray induced tunneling and electron emission from a single cobalt nanocluster on a Au(111) surface. The tip-detector is positioned a few angstroms above the nanocluster, and ramping the incident X-ray energy across the Co photoabsorption K-edge enables the detection of element specific electrons. Atomic-scale spatial dependent changes in the X-ray absorption cross section are directly measured by taking the X-ray induced current as a function of X-ray energy. From the measured sample and tip currents, element specific X-ray induced current components can be separated and thereby the corresponding yields for the X-ray induced processes of the single cobalt nanocluster can be determined. The detection of element specific synchrotron X-ray induced electrons of a single nanocluster opens a new avenue for materials characterization on a one particle at-a-time basis.
- Authors:
- Publication Date:
- Research Org.:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science - Office of Basic Energy Sciences - Scientific User Facilities Division
- OSTI Identifier:
- 1404719
- DOE Contract Number:
- AC02-06CH11357
- Resource Type:
- Journal Article
- Journal Name:
- Applied Physics Letters
- Additional Journal Information:
- Journal Volume: 111; Journal Issue: 10; Journal ID: ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; Scanning tunneling microscopy, synchrotron X-rays, X-ray microscopy, X-ray absorption, photoemission.
Citation Formats
Kersell, Heath, Shirato, Nozomi, Cummings, Marvin, Chang, Hao, Miller, Dean, Rosenmann, Daniel, Hla, Saw-Wai, and Rose, Volker. Detecting element specific electrons from a single cobalt nanocluster with synchrotron x-ray scanning tunneling microscopy. United States: N. p., 2017.
Web. doi:10.1063/1.4990818.
Kersell, Heath, Shirato, Nozomi, Cummings, Marvin, Chang, Hao, Miller, Dean, Rosenmann, Daniel, Hla, Saw-Wai, & Rose, Volker. Detecting element specific electrons from a single cobalt nanocluster with synchrotron x-ray scanning tunneling microscopy. United States. https://doi.org/10.1063/1.4990818
Kersell, Heath, Shirato, Nozomi, Cummings, Marvin, Chang, Hao, Miller, Dean, Rosenmann, Daniel, Hla, Saw-Wai, and Rose, Volker. 2017.
"Detecting element specific electrons from a single cobalt nanocluster with synchrotron x-ray scanning tunneling microscopy". United States. https://doi.org/10.1063/1.4990818.
@article{osti_1404719,
title = {Detecting element specific electrons from a single cobalt nanocluster with synchrotron x-ray scanning tunneling microscopy},
author = {Kersell, Heath and Shirato, Nozomi and Cummings, Marvin and Chang, Hao and Miller, Dean and Rosenmann, Daniel and Hla, Saw-Wai and Rose, Volker},
abstractNote = {We use a nanofabricated scanning tunneling microscope tip as a detector to investigate local X-ray induced tunneling and electron emission from a single cobalt nanocluster on a Au(111) surface. The tip-detector is positioned a few angstroms above the nanocluster, and ramping the incident X-ray energy across the Co photoabsorption K-edge enables the detection of element specific electrons. Atomic-scale spatial dependent changes in the X-ray absorption cross section are directly measured by taking the X-ray induced current as a function of X-ray energy. From the measured sample and tip currents, element specific X-ray induced current components can be separated and thereby the corresponding yields for the X-ray induced processes of the single cobalt nanocluster can be determined. The detection of element specific synchrotron X-ray induced electrons of a single nanocluster opens a new avenue for materials characterization on a one particle at-a-time basis.},
doi = {10.1063/1.4990818},
url = {https://www.osti.gov/biblio/1404719},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 10,
volume = 111,
place = {United States},
year = {Mon Sep 04 00:00:00 EDT 2017},
month = {Mon Sep 04 00:00:00 EDT 2017}
}
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Works referencing / citing this record:
X-ray magnetic circular dichroism and near-edge X-ray absorption fine structure of buried interfacial magnetism measured by using a scanning tunneling microscope tip
journal, August 2018
- Chang, H.; Shirato, N.; Zhang, Y.
- Applied Physics Letters, Vol. 113, Issue 6
X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3
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