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Title: Longitudinal bunch shaping of picosecond high-charge MeV electron beams

Abstract

With ever increasing demands for intensities in modern accelerators, the understanding of space-charge effects becomes crucial. Herein are presented measurements of optically shaped picosecond-long electron beams in a superconducting L-band linac over a wide range of charges, from 0.2 nC to 3.4 nC. At low charges, the shape of the electron beam is preserved, while at higher charge densities, modulations on the beam convert to energy modulations. Here, energy profile measurements using a spectrometer and time profile measurements using a streak camera reveal the dynamics of longitudinal space-charge on MeV-scale electron beams.

Authors:
 [1];  [2];  [2];  [2];  [2];  [2];  [2];  [2]; ORCiD logo [2];  [2];  [2]; ORCiD logo [2];  [2]
  1. Univ. of Maryland, College Park, MD (United States)
  2. Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Publication Date:
Research Org.:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
OSTI Identifier:
1402481
Report Number(s):
FERMILAB-PUB-16-703-APC
Journal ID: ISSN 1070-664X; 1512385; TRN: US1703111
Grant/Contract Number:  
AC02-07CH11359
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Physics of Plasmas
Additional Journal Information:
Journal Volume: 23; Journal Issue: 10; Journal ID: ISSN 1070-664X
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS

Citation Formats

Beaudoin, B. L., Thangaraj, J. C. T., Edstrom, Jr., D., Ruan, J., Lumpkin, A. H., Broemmelsiek, D., Carlson, K. A., Crawford, D. J., Romanov, A., Santucci, J. K., Stancari, G., Thurman-Keup, R., and Warner, A. Longitudinal bunch shaping of picosecond high-charge MeV electron beams. United States: N. p., 2016. Web. doi:10.1063/1.4964722.
Beaudoin, B. L., Thangaraj, J. C. T., Edstrom, Jr., D., Ruan, J., Lumpkin, A. H., Broemmelsiek, D., Carlson, K. A., Crawford, D. J., Romanov, A., Santucci, J. K., Stancari, G., Thurman-Keup, R., & Warner, A. Longitudinal bunch shaping of picosecond high-charge MeV electron beams. United States. doi:10.1063/1.4964722.
Beaudoin, B. L., Thangaraj, J. C. T., Edstrom, Jr., D., Ruan, J., Lumpkin, A. H., Broemmelsiek, D., Carlson, K. A., Crawford, D. J., Romanov, A., Santucci, J. K., Stancari, G., Thurman-Keup, R., and Warner, A. Thu . "Longitudinal bunch shaping of picosecond high-charge MeV electron beams". United States. doi:10.1063/1.4964722. https://www.osti.gov/servlets/purl/1402481.
@article{osti_1402481,
title = {Longitudinal bunch shaping of picosecond high-charge MeV electron beams},
author = {Beaudoin, B. L. and Thangaraj, J. C. T. and Edstrom, Jr., D. and Ruan, J. and Lumpkin, A. H. and Broemmelsiek, D. and Carlson, K. A. and Crawford, D. J. and Romanov, A. and Santucci, J. K. and Stancari, G. and Thurman-Keup, R. and Warner, A.},
abstractNote = {With ever increasing demands for intensities in modern accelerators, the understanding of space-charge effects becomes crucial. Herein are presented measurements of optically shaped picosecond-long electron beams in a superconducting L-band linac over a wide range of charges, from 0.2 nC to 3.4 nC. At low charges, the shape of the electron beam is preserved, while at higher charge densities, modulations on the beam convert to energy modulations. Here, energy profile measurements using a spectrometer and time profile measurements using a streak camera reveal the dynamics of longitudinal space-charge on MeV-scale electron beams.},
doi = {10.1063/1.4964722},
journal = {Physics of Plasmas},
number = 10,
volume = 23,
place = {United States},
year = {Thu Oct 20 00:00:00 EDT 2016},
month = {Thu Oct 20 00:00:00 EDT 2016}
}

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Works referenced in this record:

Efficient temporal shaping of ultrashort pulses with birefringent crystals
journal, January 2007

  • Zhou, Shian; Ouzounov, Dimitre; Li, Heng
  • Applied Optics, Vol. 46, Issue 35, p. 8488-8492
  • DOI: 10.1364/AO.46.008488