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Title: Enhanced Dual Confocal Measurement System

Abstract

A measurement instrument utilizing dual, chromatic, confocal, distance sensors has been jointly developed by General Atomics (GA) and Sandia National Laboratories (SNL) for thickness and flatness measurement of target components used in dynamic materials properties (DMP) experiments on the SNL Z-Machine (Z). Compared to previous methods used in production of these types of targets, the tool saves time and yields a 4x reduction in thickness uncertainty which is one of the largest sources of error in equation of state (EOS) measurements critical to supporting the NNSA’s Stockpile Stewardship program and computer modeling of high energy density experiments. It has numerous differences from earlier instruments operating on the dual confocal sensor principle to accommodate DMP components including larger lateral travel, longer working distance, ability to measure flatness in addition to thickness, built-in thickness calibration standards for quickly checking calibration before and after each measurement, and streamlined operation. Thickness and flatness of 0.2mm-3.3mm thick sections of diamond machined copper and aluminum can be measured to “sub-micron” accuracy. Sections up to 6mm thick can be measured with as-yet undermined accuracy. Furthermore, samples must have one surface which is flat to within 300µm, lateral dimensions of no more than 50mm x 50mm, and heightmore » less than 40mm.« less

Authors:
 [1];  [2];  [1];  [1];  [1];  [1]
  1. General Atomics, San Diego, CA (United States)
  2. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
Research Org.:
General Atomics, San Diego, CA (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1402464
Grant/Contract Number:
NA0001808; NA003525
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Fusion Science and Technology
Additional Journal Information:
Journal Volume: 73; Journal Issue: 2; Journal ID: ISSN 1536-1055
Publisher:
American Nuclear Society
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; Dynamic materials properties; Z-Machine; equation of state

Citation Formats

Tomlinson, Kurt, Seagle, C. T., Huang, H., Smith, G. E., Taylor, J. L., and Paguio, R. R. Enhanced Dual Confocal Measurement System. United States: N. p., 2017. Web. doi:10.1080/15361055.2017.1387449.
Tomlinson, Kurt, Seagle, C. T., Huang, H., Smith, G. E., Taylor, J. L., & Paguio, R. R. Enhanced Dual Confocal Measurement System. United States. doi:10.1080/15361055.2017.1387449.
Tomlinson, Kurt, Seagle, C. T., Huang, H., Smith, G. E., Taylor, J. L., and Paguio, R. R. Wed . "Enhanced Dual Confocal Measurement System". United States. doi:10.1080/15361055.2017.1387449.
@article{osti_1402464,
title = {Enhanced Dual Confocal Measurement System},
author = {Tomlinson, Kurt and Seagle, C. T. and Huang, H. and Smith, G. E. and Taylor, J. L. and Paguio, R. R.},
abstractNote = {A measurement instrument utilizing dual, chromatic, confocal, distance sensors has been jointly developed by General Atomics (GA) and Sandia National Laboratories (SNL) for thickness and flatness measurement of target components used in dynamic materials properties (DMP) experiments on the SNL Z-Machine (Z). Compared to previous methods used in production of these types of targets, the tool saves time and yields a 4x reduction in thickness uncertainty which is one of the largest sources of error in equation of state (EOS) measurements critical to supporting the NNSA’s Stockpile Stewardship program and computer modeling of high energy density experiments. It has numerous differences from earlier instruments operating on the dual confocal sensor principle to accommodate DMP components including larger lateral travel, longer working distance, ability to measure flatness in addition to thickness, built-in thickness calibration standards for quickly checking calibration before and after each measurement, and streamlined operation. Thickness and flatness of 0.2mm-3.3mm thick sections of diamond machined copper and aluminum can be measured to “sub-micron” accuracy. Sections up to 6mm thick can be measured with as-yet undermined accuracy. Furthermore, samples must have one surface which is flat to within 300µm, lateral dimensions of no more than 50mm x 50mm, and height less than 40mm.},
doi = {10.1080/15361055.2017.1387449},
journal = {Fusion Science and Technology},
number = 2,
volume = 73,
place = {United States},
year = {Wed Nov 29 00:00:00 EST 2017},
month = {Wed Nov 29 00:00:00 EST 2017}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on November 29, 2018
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