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Title: Combined near- and far-field high-energy diffraction microscopy dataset for Ti-7Al tensile specimen elastically loaded in situ

Abstract

High-energy diffraction microscopy (HEDM) constitutes a suite of combined X-ray characterization methods, which hold the unique advantage of illuminating the microstructure and micromechanical state of a material during concurrent in situ mechanical deformation. The data generated from HEDM experiments provides a heretofore unrealized opportunity to validate meso-scale modeling techniques, such as crystal plasticity finite element modeling (CPFEM), by explicitly testing the accuracy of these models at the length scales where the models predict their response. Combining HEDM methods with in situ loading under known and controlled boundary conditions represents a significant challenge, inspiring the recent development of a new high-precision rotation and axial motion system for simultaneously rotating and axially loading a sample. In this paper, we describe the initial HEDM dataset collected using this hardware on an alpha-titanium alloy (Ti-7Al) under in situ tensile deformation at the Advanced Photon Source, Argonne National Laboratory. We present both near-field HEDM data that maps out the grain morphology and intragranular crystallographic orientations and far-field HEDM data that provides the grain centroid, grain average crystallographic orientation, and grain average elastic strain tensor for each grain. Finally, we provide a finite element mesh that can be utilized to simulate deformation in the volume ofmore » this Ti-7Al specimen.« less

Authors:
 [1];  [1];  [2];  [2];  [1];  [3];  [4];  [5];  [6];  [7];  [5]
  1. Air Force Research Lab. (AFRL), Wright-Patterson AFB, OH (United States)
  2. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  3. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Carnegie Mellon Univ., Pittsburgh, PA (United States)
  4. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  5. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
  6. Carnegie Mellon Univ., Pittsburgh, PA (United States)
  7. PulseRay, Beaver Dams, WI (United States)
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1399714
Report Number(s):
LLNL-JRNL-738584
Journal ID: ISSN 2193-9764; TRN: US1702970
Grant/Contract Number:  
AC52-07NA27344
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Integrating Materials and Manufacturing Innovation
Additional Journal Information:
Journal Volume: 5; Journal Issue: 1; Journal ID: ISSN 2193-9764
Publisher:
Springer
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Turner, Todd J., Shade, Paul A., Bernier, Joel V., Li, Shiu Fai, Schuren, Jay C., Lind, Jonathan, Lienert, Ulrich, Kenesei, Peter, Suter, Robert M., Blank, Basil, and Almer, Jonathan. Combined near- and far-field high-energy diffraction microscopy dataset for Ti-7Al tensile specimen elastically loaded in situ. United States: N. p., 2016. Web. doi:10.1186/s40192-016-0048-1.
Turner, Todd J., Shade, Paul A., Bernier, Joel V., Li, Shiu Fai, Schuren, Jay C., Lind, Jonathan, Lienert, Ulrich, Kenesei, Peter, Suter, Robert M., Blank, Basil, & Almer, Jonathan. Combined near- and far-field high-energy diffraction microscopy dataset for Ti-7Al tensile specimen elastically loaded in situ. United States. doi:10.1186/s40192-016-0048-1.
Turner, Todd J., Shade, Paul A., Bernier, Joel V., Li, Shiu Fai, Schuren, Jay C., Lind, Jonathan, Lienert, Ulrich, Kenesei, Peter, Suter, Robert M., Blank, Basil, and Almer, Jonathan. Fri . "Combined near- and far-field high-energy diffraction microscopy dataset for Ti-7Al tensile specimen elastically loaded in situ". United States. doi:10.1186/s40192-016-0048-1. https://www.osti.gov/servlets/purl/1399714.
@article{osti_1399714,
title = {Combined near- and far-field high-energy diffraction microscopy dataset for Ti-7Al tensile specimen elastically loaded in situ},
author = {Turner, Todd J. and Shade, Paul A. and Bernier, Joel V. and Li, Shiu Fai and Schuren, Jay C. and Lind, Jonathan and Lienert, Ulrich and Kenesei, Peter and Suter, Robert M. and Blank, Basil and Almer, Jonathan},
abstractNote = {High-energy diffraction microscopy (HEDM) constitutes a suite of combined X-ray characterization methods, which hold the unique advantage of illuminating the microstructure and micromechanical state of a material during concurrent in situ mechanical deformation. The data generated from HEDM experiments provides a heretofore unrealized opportunity to validate meso-scale modeling techniques, such as crystal plasticity finite element modeling (CPFEM), by explicitly testing the accuracy of these models at the length scales where the models predict their response. Combining HEDM methods with in situ loading under known and controlled boundary conditions represents a significant challenge, inspiring the recent development of a new high-precision rotation and axial motion system for simultaneously rotating and axially loading a sample. In this paper, we describe the initial HEDM dataset collected using this hardware on an alpha-titanium alloy (Ti-7Al) under in situ tensile deformation at the Advanced Photon Source, Argonne National Laboratory. We present both near-field HEDM data that maps out the grain morphology and intragranular crystallographic orientations and far-field HEDM data that provides the grain centroid, grain average crystallographic orientation, and grain average elastic strain tensor for each grain. Finally, we provide a finite element mesh that can be utilized to simulate deformation in the volume of this Ti-7Al specimen.},
doi = {10.1186/s40192-016-0048-1},
journal = {Integrating Materials and Manufacturing Innovation},
issn = {2193-9764},
number = 1,
volume = 5,
place = {United States},
year = {2016},
month = {3}
}

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Works referenced in this record:

An introduction to three-dimensional X-ray diffraction microscopy
journal, October 2012