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Title: X-Ray Characterization of Resistor/Dielectric Material for Low Temperature Co-Fired Ceramic Packages

Abstract

High temperature XRD has been employed to monitor the devitrification of Dupont 951 low temperature co-fired ceramic (LTCC) and Dupont E84005 resistor ink. The LTCC underwent devitrification to an anorthite phase in the range of 835-875 C with activation energy of 180 kJ/mol as calculated from kinetic data. The resistor paste underwent devitrification in the 835-875 C range forming monoclinic and hexagonal celcian phases plus a phase believed to be a zinc-silicate. RuO{sub 2} appeared to be stable within this devitrified resistor matrix. X-ray radiography of a co-fired circuit indicated good structural/chemical compatibility between the resistor and LTCC.

Authors:
; ; ;
Publication Date:
Research Org.:
Sandia National Labs., Albuquerque, NM (US); Sandia National Labs., Livermore, CA (US)
Sponsoring Org.:
US Department of Energy (US)
OSTI Identifier:
13995
Report Number(s):
SAND99-2324C
TRN: AH200135%%532
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Denver X-Ray Conference, Steamboat Springs, CO (US), 08/02/1999--08/06/1999; Other Information: PBD: 8 Sep 1999
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 42 ENGINEERING; ACTIVATION ENERGY; CERAMICS; COMPATIBILITY; KINETICS; MONITORS; RESISTORS; X-RAY RADIOGRAPHY; DECOMPOSITION; PHASE TRANSFORMATIONS

Citation Formats

DIMOS,DUANE B., KOTULA,PAUL G., RODRIGUEZ,MARK A., and YANG,PIN. X-Ray Characterization of Resistor/Dielectric Material for Low Temperature Co-Fired Ceramic Packages. United States: N. p., 1999. Web.
DIMOS,DUANE B., KOTULA,PAUL G., RODRIGUEZ,MARK A., & YANG,PIN. X-Ray Characterization of Resistor/Dielectric Material for Low Temperature Co-Fired Ceramic Packages. United States.
DIMOS,DUANE B., KOTULA,PAUL G., RODRIGUEZ,MARK A., and YANG,PIN. Wed . "X-Ray Characterization of Resistor/Dielectric Material for Low Temperature Co-Fired Ceramic Packages". United States. https://www.osti.gov/servlets/purl/13995.
@article{osti_13995,
title = {X-Ray Characterization of Resistor/Dielectric Material for Low Temperature Co-Fired Ceramic Packages},
author = {DIMOS,DUANE B. and KOTULA,PAUL G. and RODRIGUEZ,MARK A. and YANG,PIN},
abstractNote = {High temperature XRD has been employed to monitor the devitrification of Dupont 951 low temperature co-fired ceramic (LTCC) and Dupont E84005 resistor ink. The LTCC underwent devitrification to an anorthite phase in the range of 835-875 C with activation energy of 180 kJ/mol as calculated from kinetic data. The resistor paste underwent devitrification in the 835-875 C range forming monoclinic and hexagonal celcian phases plus a phase believed to be a zinc-silicate. RuO{sub 2} appeared to be stable within this devitrified resistor matrix. X-ray radiography of a co-fired circuit indicated good structural/chemical compatibility between the resistor and LTCC.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1999},
month = {9}
}

Conference:
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