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Title: Measuring Electron Capture in 193Pt with Microcalorimeters

Authors:
ORCiD logo [1];  [1]; ORCiD logo [1];  [2]; ORCiD logo [1];  [3];  [1]; ORCiD logo [1]
  1. Los Alamos National Laboratory
  2. Western Michigan University
  3. NIST
Publication Date:
Research Org.:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org.:
USDOE Office of Nuclear Energy (NE)
OSTI Identifier:
1398895
Report Number(s):
LA-UR-17-29149
DOE Contract Number:  
AC52-06NA25396
Resource Type:
Conference
Resource Relation:
Conference: 17th international Workshop on Low Temperature Detectors ; 2017-07-17 - 2017-07-17 ; Kurume, Japan
Country of Publication:
United States
Language:
English
Subject:
Atomic and Nuclear Physics

Citation Formats

Koehler, Katrina Elizabeth, Famiano, Michael A., Fontes, Christopher John, Gorczyca, Thomas, Rabin, Michael W., Schmidt, Dan, Ullom, Joel Nathan, and Croce, Mark Philip. Measuring Electron Capture in 193Pt with Microcalorimeters. United States: N. p., 2017. Web.
Koehler, Katrina Elizabeth, Famiano, Michael A., Fontes, Christopher John, Gorczyca, Thomas, Rabin, Michael W., Schmidt, Dan, Ullom, Joel Nathan, & Croce, Mark Philip. Measuring Electron Capture in 193Pt with Microcalorimeters. United States.
Koehler, Katrina Elizabeth, Famiano, Michael A., Fontes, Christopher John, Gorczyca, Thomas, Rabin, Michael W., Schmidt, Dan, Ullom, Joel Nathan, and Croce, Mark Philip. Thu . "Measuring Electron Capture in 193Pt with Microcalorimeters". United States. doi:. https://www.osti.gov/servlets/purl/1398895.
@article{osti_1398895,
title = {Measuring Electron Capture in 193Pt with Microcalorimeters},
author = {Koehler, Katrina Elizabeth and Famiano, Michael A. and Fontes, Christopher John and Gorczyca, Thomas and Rabin, Michael W. and Schmidt, Dan and Ullom, Joel Nathan and Croce, Mark Philip},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Oct 05 00:00:00 EDT 2017},
month = {Thu Oct 05 00:00:00 EDT 2017}
}

Conference:
Other availability
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