MATERIALS ASSURANCE THROUGH ORTHOGONAL MATERIALS MEASUREMENTS: X-RAY FLUORESCENCE ASPECTS.

Conference · Thu Sep 01 00:00:00 EDT 2016

DOI:https://doi.org/10.1017/S0885715617000446· OSTI ID:1398361

Rodriguez, Mark A.; Mowry, Curtis D.; Van Benthem, Mark; Yang, Pin; Enos, David; Griego, James; Susan, Donald F.

Abstract not provided.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1398361
• Report Number(s): SAND2016-9801C; 647906
• Resource Relation: Journal Volume: 32; Journal Issue: 02; Conference: Proposed for presentation at the Denver X-ray Conference held August 1-5, 2016 in Chicago, IL.
• Country of Publication: United States
• Language: English