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Title: Achieving diffraction-limited nanometer-scale X-ray point focus with two crossed multilayer Laue lenses: alignment challenges

Abstract

In this article, we discuss misalignment-induced aberrations in a pair of crossed multilayer Laue lenses used for achieving a nanometer-scale x-ray point focus. We thoroughly investigate the impacts of two most important contributions, the orthogonality and the separation distance between two lenses. We find that misalignment in the orthogonality results in astigmatism at 45º and other inclination angles when coupled with a separation distance error. Theoretical explanation and experimental verification are provided. We show that to achieve a diffraction-limited point focus, accurate alignment of the azimuthal angle is required to ensure orthogonality between two lenses, and the required accuracy is scaled with the ratio of the focus size to the aperture size.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1]
  1. Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1396639
Alternate Identifier(s):
OSTI ID: 1426464
Report Number(s):
BNL-203355-2018-JAAM
Journal ID: ISSN 1094-4087; OPEXFF
Grant/Contract Number:  
SC0012704
Resource Type:
Journal Article: Published Article
Journal Name:
Optics Express
Additional Journal Information:
Journal Volume: 25; Journal Issue: 21; Journal ID: ISSN 1094-4087
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY

Citation Formats

Yan, Hanfei, Huang, Xiaojing, Bouet, Nathalie, Zhou, Juan, Nazaretski, Evgeny, and Chu, Yong S. Achieving diffraction-limited nanometer-scale X-ray point focus with two crossed multilayer Laue lenses: alignment challenges. United States: N. p., 2017. Web. doi:10.1364/OE.25.025234.
Yan, Hanfei, Huang, Xiaojing, Bouet, Nathalie, Zhou, Juan, Nazaretski, Evgeny, & Chu, Yong S. Achieving diffraction-limited nanometer-scale X-ray point focus with two crossed multilayer Laue lenses: alignment challenges. United States. doi:10.1364/OE.25.025234.
Yan, Hanfei, Huang, Xiaojing, Bouet, Nathalie, Zhou, Juan, Nazaretski, Evgeny, and Chu, Yong S. Mon . "Achieving diffraction-limited nanometer-scale X-ray point focus with two crossed multilayer Laue lenses: alignment challenges". United States. doi:10.1364/OE.25.025234.
@article{osti_1396639,
title = {Achieving diffraction-limited nanometer-scale X-ray point focus with two crossed multilayer Laue lenses: alignment challenges},
author = {Yan, Hanfei and Huang, Xiaojing and Bouet, Nathalie and Zhou, Juan and Nazaretski, Evgeny and Chu, Yong S.},
abstractNote = {In this article, we discuss misalignment-induced aberrations in a pair of crossed multilayer Laue lenses used for achieving a nanometer-scale x-ray point focus. We thoroughly investigate the impacts of two most important contributions, the orthogonality and the separation distance between two lenses. We find that misalignment in the orthogonality results in astigmatism at 45º and other inclination angles when coupled with a separation distance error. Theoretical explanation and experimental verification are provided. We show that to achieve a diffraction-limited point focus, accurate alignment of the azimuthal angle is required to ensure orthogonality between two lenses, and the required accuracy is scaled with the ratio of the focus size to the aperture size.},
doi = {10.1364/OE.25.025234},
journal = {Optics Express},
number = 21,
volume = 25,
place = {United States},
year = {Mon Oct 16 00:00:00 EDT 2017},
month = {Mon Oct 16 00:00:00 EDT 2017}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1364/OE.25.025234

Citation Metrics:
Cited by: 3 works
Citation information provided by
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