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Title: Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

Abstract

Four-dimensional scanning transmission electron microscopy (4D-STEM) is a technique where a full two-dimensional convergent beam electron diffraction (CBED) pattern is acquired at every STEM pixel scanned. Capturing the full diffraction pattern provides a rich dataset that potentially contains more information about the specimen than is contained in conventional imaging modes using conventional integrating detectors. In this work, using 4D datasets in STEM from two specimens, monolayer MoS2 and bulk SrTiO3, we demonstrate multiple STEM imaging modes on a quantitative absolute intensity scale, including phase reconstruction of the transmission function via differential phase contrast imaging. Finally, practical issues about sampling (i.e. number of detector pixels), signal-to-noise enhancement and data reduction of large 4D-STEM datasets are emphasized.

Authors:
 [1];  [1];  [2];  [2];  [1];  [1];  [3];  [3];  [1]
  1. Monash University, Clayton, VIC (Australia)
  2. Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). National Center for Electron Microscopy, Molecular Foundry
  3. University of Melbourne (Australia)
Publication Date:
Research Org.:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1377511
Alternate Identifier(s):
OSTI ID: 1396446
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Volume: 169; Journal Issue: C; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; diffractive imaging; convergent beam electron diffraction; differential phase contrast; phase reconstruction

Citation Formats

Chen, Z., Weyland, M., Ercius, P., Ciston, J., Zheng, C., Fuhrer, M. S., D'Alfonso, A. J., Allen, L. J., and Findlay, S. D. Practical aspects of diffractive imaging using an atomic-scale coherent electron probe. United States: N. p., 2016. Web. doi:10.1016/j.ultramic.2016.06.009.
Chen, Z., Weyland, M., Ercius, P., Ciston, J., Zheng, C., Fuhrer, M. S., D'Alfonso, A. J., Allen, L. J., & Findlay, S. D. Practical aspects of diffractive imaging using an atomic-scale coherent electron probe. United States. https://doi.org/10.1016/j.ultramic.2016.06.009
Chen, Z., Weyland, M., Ercius, P., Ciston, J., Zheng, C., Fuhrer, M. S., D'Alfonso, A. J., Allen, L. J., and Findlay, S. D. 2016. "Practical aspects of diffractive imaging using an atomic-scale coherent electron probe". United States. https://doi.org/10.1016/j.ultramic.2016.06.009. https://www.osti.gov/servlets/purl/1377511.
@article{osti_1377511,
title = {Practical aspects of diffractive imaging using an atomic-scale coherent electron probe},
author = {Chen, Z. and Weyland, M. and Ercius, P. and Ciston, J. and Zheng, C. and Fuhrer, M. S. and D'Alfonso, A. J. and Allen, L. J. and Findlay, S. D.},
abstractNote = {Four-dimensional scanning transmission electron microscopy (4D-STEM) is a technique where a full two-dimensional convergent beam electron diffraction (CBED) pattern is acquired at every STEM pixel scanned. Capturing the full diffraction pattern provides a rich dataset that potentially contains more information about the specimen than is contained in conventional imaging modes using conventional integrating detectors. In this work, using 4D datasets in STEM from two specimens, monolayer MoS2 and bulk SrTiO3, we demonstrate multiple STEM imaging modes on a quantitative absolute intensity scale, including phase reconstruction of the transmission function via differential phase contrast imaging. Finally, practical issues about sampling (i.e. number of detector pixels), signal-to-noise enhancement and data reduction of large 4D-STEM datasets are emphasized.},
doi = {10.1016/j.ultramic.2016.06.009},
url = {https://www.osti.gov/biblio/1377511}, journal = {Ultramicroscopy},
issn = {0304-3991},
number = C,
volume = 169,
place = {United States},
year = {Sat Jun 25 00:00:00 EDT 2016},
month = {Sat Jun 25 00:00:00 EDT 2016}
}

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Cited by: 20 works
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Works referencing / citing this record:

Correcting the linear and nonlinear distortions for atomically resolved STEM spectrum and diffraction imaging
journal, January 2018