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Title: Atomic Scale Investigations of Interfacial Line Defects.

Abstract

Abstract not provided.

Authors:
Publication Date:
Research Org.:
Sandia National Lab. (SNL-CA), Livermore, CA (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1395814
Report Number(s):
SAND2016-9541PE
647716
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Seminar, Chimie ParisTech held October 7, 2016 in Paris, France.
Country of Publication:
United States
Language:
English

Citation Formats

Medlin, Douglas L. Atomic Scale Investigations of Interfacial Line Defects.. United States: N. p., 2016. Web.
Medlin, Douglas L. Atomic Scale Investigations of Interfacial Line Defects.. United States.
Medlin, Douglas L. 2016. "Atomic Scale Investigations of Interfacial Line Defects.". United States. doi:. https://www.osti.gov/servlets/purl/1395814.
@article{osti_1395814,
title = {Atomic Scale Investigations of Interfacial Line Defects.},
author = {Medlin, Douglas L.},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = 2016,
month = 9
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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