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Title: Understanding Photon / Free Carrier Interaction in LVP Signals on Ultra-Thin Silicon ICs.

Abstract

This project investigated a recently patented Sandia technology known as visible light Laser Voltage Probing (LVP). In this effort we carefully prepared well understood and characterized samples for testing. These samples were then operated across a range of configurations to minimize the possibility of superposition of multiple photon carrier interactions as data was taken with conventional and visible light LVP systems. Data consisted of LVP waveforms and Laser Voltage Images (LVI). Visible light (633 nm) LVP data was compared against 1319 nm and 1064 nm conventional LVP data to better understand the similarities and differences in mechanisms for all wavelengths of light investigated. The full text can be obtained by reaching the project manager, Ed Cole or the Cyber IA lead, Justin Ford.

Authors:
 [1];  [1];  [1];  [1];  [1]
  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1395207
Report Number(s):
SAND2017-10120
657070
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Beutler, Joshua, Cole, Jr., Edward I., Smith, Norman F., Clement, John Joseph, and Friedman, Caitlin Anne Rochford. Understanding Photon / Free Carrier Interaction in LVP Signals on Ultra-Thin Silicon ICs.. United States: N. p., 2017. Web. doi:10.2172/1395207.
Beutler, Joshua, Cole, Jr., Edward I., Smith, Norman F., Clement, John Joseph, & Friedman, Caitlin Anne Rochford. Understanding Photon / Free Carrier Interaction in LVP Signals on Ultra-Thin Silicon ICs.. United States. doi:10.2172/1395207.
Beutler, Joshua, Cole, Jr., Edward I., Smith, Norman F., Clement, John Joseph, and Friedman, Caitlin Anne Rochford. Fri . "Understanding Photon / Free Carrier Interaction in LVP Signals on Ultra-Thin Silicon ICs.". United States. doi:10.2172/1395207. https://www.osti.gov/servlets/purl/1395207.
@article{osti_1395207,
title = {Understanding Photon / Free Carrier Interaction in LVP Signals on Ultra-Thin Silicon ICs.},
author = {Beutler, Joshua and Cole, Jr., Edward I. and Smith, Norman F. and Clement, John Joseph and Friedman, Caitlin Anne Rochford},
abstractNote = {This project investigated a recently patented Sandia technology known as visible light Laser Voltage Probing (LVP). In this effort we carefully prepared well understood and characterized samples for testing. These samples were then operated across a range of configurations to minimize the possibility of superposition of multiple photon carrier interactions as data was taken with conventional and visible light LVP systems. Data consisted of LVP waveforms and Laser Voltage Images (LVI). Visible light (633 nm) LVP data was compared against 1319 nm and 1064 nm conventional LVP data to better understand the similarities and differences in mechanisms for all wavelengths of light investigated. The full text can be obtained by reaching the project manager, Ed Cole or the Cyber IA lead, Justin Ford.},
doi = {10.2172/1395207},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Sep 01 00:00:00 EDT 2017},
month = {Fri Sep 01 00:00:00 EDT 2017}
}

Technical Report:

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