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Title: Coherently strained epitaxial Pb(Zr1-xTix)O3 thin films

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4825215· OSTI ID:1395113

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
DOE Contract Number:
AC02-06CH11357
OSTI ID:
1395113
Journal Information:
Journal of Applied Physics, Vol. 114, Issue 16; ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English

References (11)

Strain Phase Diagram and Domain Orientation in SrTiO 3 Thin Films journal May 2005
The classification of tilted octahedra in perovskites journal November 1972
Calculation of critical layer thickness versus lattice mismatch for Ge x Si 1− x /Si strained‐layer heterostructures journal August 1985
Octahedral tilt transitions in relaxed epitaxial Pb(Zr 1− x Ti x )O 3 films journal May 2011
Misfit strain accommodation in epitaxial A B O 3 perovskites: Lattice rotations and lattice modulations journal February 2011
Enhancement of Ferroelectricity in Strained BaTiO3 Thin Films journal November 2004
Materials for high temperature acoustic and vibration sensors: A review journal January 1994
Structural phase transition in epitaxial perovskite films journal December 2004
Tilt transitions in compressively strained AgTa 0.5 Nb 0.5 O 3 thin films journal October 2011
Quantifying octahedral rotations in strained perovskite oxide films journal July 2010
Strain Tuning of Ferroelectric Thin Films journal August 2007

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