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Title: Mapping cation diffusion through lattice defects in epitaxial oxide thin films on the water-soluble buffer layer Sr 3 Al 2 O 6 using atomic resolution electron microscopy

Authors:
 [1];  [2];  [3];  [4]; ORCiD logo [5]
  1. School of Electrical and Computer Engineering, Cornell University, Ithaca, New York 14853, USA
  2. Department of Physics, Stanford University, Stanford, California 94305, USA
  3. Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
  4. Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA, Department of Applied Physics, Stanford University, Stanford, California 94305, USA
  5. School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA, Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, New York 14853, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1394853
Grant/Contract Number:  
AC02-76SF00515
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
APL Materials
Additional Journal Information:
Journal Name: APL Materials Journal Volume: 5 Journal Issue: 9; Journal ID: ISSN 2166-532X
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Baek, David J., Lu, Di, Hikita, Yasuyuki, Hwang, Harold Y., and Kourkoutis, Lena F. Mapping cation diffusion through lattice defects in epitaxial oxide thin films on the water-soluble buffer layer Sr 3 Al 2 O 6 using atomic resolution electron microscopy. United States: N. p., 2017. Web. doi:10.1063/1.4994538.
Baek, David J., Lu, Di, Hikita, Yasuyuki, Hwang, Harold Y., & Kourkoutis, Lena F. Mapping cation diffusion through lattice defects in epitaxial oxide thin films on the water-soluble buffer layer Sr 3 Al 2 O 6 using atomic resolution electron microscopy. United States. doi:10.1063/1.4994538.
Baek, David J., Lu, Di, Hikita, Yasuyuki, Hwang, Harold Y., and Kourkoutis, Lena F. Fri . "Mapping cation diffusion through lattice defects in epitaxial oxide thin films on the water-soluble buffer layer Sr 3 Al 2 O 6 using atomic resolution electron microscopy". United States. doi:10.1063/1.4994538.
@article{osti_1394853,
title = {Mapping cation diffusion through lattice defects in epitaxial oxide thin films on the water-soluble buffer layer Sr 3 Al 2 O 6 using atomic resolution electron microscopy},
author = {Baek, David J. and Lu, Di and Hikita, Yasuyuki and Hwang, Harold Y. and Kourkoutis, Lena F.},
abstractNote = {},
doi = {10.1063/1.4994538},
journal = {APL Materials},
number = 9,
volume = 5,
place = {United States},
year = {Fri Sep 01 00:00:00 EDT 2017},
month = {Fri Sep 01 00:00:00 EDT 2017}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1063/1.4994538

Citation Metrics:
Cited by: 1 work
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Works referenced in this record:

Enhancement of Ferroelectricity in Strained BaTiO3 Thin Films
journal, November 2004