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Title: On-the-fly segmentation approaches for x-ray diffraction datasets for metallic glasses

Abstract

Investment in brighter sources and larger detectors has resulted in an explosive rise in the data collected at synchrotron facilities. Currently, human experts extract scientific information from these data, but they cannot keep pace with the rate of data collection. Here, we present three on-the-fly approaches—attribute extraction, nearest-neighbor distance, and cluster analysis—to quickly segment x-ray diffraction (XRD) data into groups with similar XRD profiles. An expert can then analyze representative spectra from each group in detail with much reduced time, but without loss of scientific insights. As a result, on-the-fly segmentation would, therefore, result in accelerated scientific productivity.

Authors:
 [1];  [2];  [3];  [1]
  1. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  2. Univ. of South Carolina, Columbia, SC (United States)
  3. National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1394638
Grant/Contract Number:
AC02-76SF00515
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
MRS Communications
Additional Journal Information:
Journal Volume: 7; Journal Issue: 03; Journal ID: ISSN 2159-6859
Publisher:
Materials Research Society - Cambridge University Press
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; X-ray diffraction (XRD); amorphous metal

Citation Formats

Ren, Fang, Williams, Travis, Hattrick-Simpers, Jason, and Mehta, Apurva. On-the-fly segmentation approaches for x-ray diffraction datasets for metallic glasses. United States: N. p., 2017. Web. doi:10.1557/mrc.2017.76.
Ren, Fang, Williams, Travis, Hattrick-Simpers, Jason, & Mehta, Apurva. On-the-fly segmentation approaches for x-ray diffraction datasets for metallic glasses. United States. doi:10.1557/mrc.2017.76.
Ren, Fang, Williams, Travis, Hattrick-Simpers, Jason, and Mehta, Apurva. Wed . "On-the-fly segmentation approaches for x-ray diffraction datasets for metallic glasses". United States. doi:10.1557/mrc.2017.76.
@article{osti_1394638,
title = {On-the-fly segmentation approaches for x-ray diffraction datasets for metallic glasses},
author = {Ren, Fang and Williams, Travis and Hattrick-Simpers, Jason and Mehta, Apurva},
abstractNote = {Investment in brighter sources and larger detectors has resulted in an explosive rise in the data collected at synchrotron facilities. Currently, human experts extract scientific information from these data, but they cannot keep pace with the rate of data collection. Here, we present three on-the-fly approaches—attribute extraction, nearest-neighbor distance, and cluster analysis—to quickly segment x-ray diffraction (XRD) data into groups with similar XRD profiles. An expert can then analyze representative spectra from each group in detail with much reduced time, but without loss of scientific insights. As a result, on-the-fly segmentation would, therefore, result in accelerated scientific productivity.},
doi = {10.1557/mrc.2017.76},
journal = {MRS Communications},
number = 03,
volume = 7,
place = {United States},
year = {Wed Aug 30 00:00:00 EDT 2017},
month = {Wed Aug 30 00:00:00 EDT 2017}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on August 30, 2018
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